故障树分析在半导体封装与测试研发项目风险定量评价中的应用

发布时间：2018-07-31 19:38

【摘要】：随着中国经济的发展,半导体行业在我国扮演着越来越重要的角色,消费电子、能源汽车、半导体照明、航天航空等等都离不开半导体。根据中国半导体行业协会统计,2014年中国集成电路产业中封装与测试业销售额同比增长成两位数。作为整个集成电路产业链末端的半导体封装与测试,为整个半导体产业链发挥着极其重要的作用,而半导体封装与测试的项目研发又对半导体封装与测试企业起着至关重要的作用。目前半导体封装与测试的项目研发受到设计、工艺、原材料、环境等等诸多因素的影响,对项目研发存在着诸多的风险,因此半导体封装与测试研发项目的风险定量评价就显得尤为关键。本文运用故障树原理分析与案例相结合的方法,以DFN8x8研发项目为案例,对半导体封装与测试研发项目进行风险定量评价。首先,介绍半导体封装与测试研发项目和风险和故障树分析的基本概念。其次,简述公司自身经营状况及存在的问题。然后,以DFN8x8研发项目为案例,基于故障树分析对DFN8x8研发项目的风险进行定量评价,从故障树的建立、定性分析、定量分析等方面进行综合评价,依据定量评价,对于概率重要度高的风险提出相应的防范措施。最后,分析概率重要度高的风险的预防措施实施过程并检验其效果。本文对于DFN8x8研发项目的成功率、研发时间、经济效益、资源浪费等方面都具有重要的实践意义,同时对于半导体封装与测试其它研发项目也有一定的借鉴意义。
[Abstract]:With the development of China's economy, semiconductor industry plays an increasingly important role in China. Consumer electronics, energy vehicles, semiconductor lighting, aerospace and so on can not be separated from semiconductors. According to the China Semiconductor Industry Association, sales of packaging and testing in China's integrated circuit industry increased to double digits in 2014 from a year earlier. As the end of the integrated circuit industry chain, the semiconductor packaging and testing plays an extremely important role for the entire semiconductor industry chain. The research and development of semiconductor packaging and testing plays an important role in semiconductor packaging and testing enterprises. At present, the research and development of semiconductor packaging and testing is influenced by many factors, such as design, process, raw materials, environment and so on. Therefore, the risk quantitative evaluation of semiconductor packaging and testing R & D projects is particularly critical. In this paper, the risk quantitative evaluation of semiconductor packaging and test R & D project is carried out by using the method of fault tree principle analysis and case study, taking the DFN8x8 R & D project as a case. Firstly, the basic concepts of semiconductor packaging and testing R & D project and risk and fault tree analysis are introduced. Second, the company's own business situation and problems. Then, taking the DFN8x8 R & D project as a case, the risk of DFN8x8 R & D project is evaluated quantitatively based on fault tree analysis, and comprehensive evaluation is made from the aspects of fault tree establishment, qualitative analysis, quantitative analysis and so on. The corresponding preventive measures are put forward for the risk of high probability importance. Finally, the process of implementing preventive measures with high probabilistic importance is analyzed and its effect is tested. This paper has important practical significance for DFN8x8 R & D project success rate, R & D time, economic benefit, resource waste and so on. At the same time, it can also be used for reference for semiconductor packaging and testing other R & D projects.
【学位授予单位】：华东理工大学
【学位级别】：硕士
【学位授予年份】：2017
【分类号】：F273.1;F426.6

【参考文献】