近环境温度下材料发射率测量方法的研究
发布时间：2018-11-06 08:14
【摘要】：材料发射率作为反映材料热辐射特性的一个重要物理量,它可以展示材料辐射能力的强弱。同一种样品因测试方法的不同,测得的发射率数值也不同。由于发射率是一种比较复杂的参数,其影响因素的复杂性带来了对应测量技术的多样性。目前,许多测量系统价格昂贵、测量条件要求较高,所以研究一种可应用于实际工程上的发射率测量方法是十分必要的。本文提出了包含环境辐射影响的有效辐射、有效亮度温度和有效光谱发射率的概念,在此基础上,针对发射率测量的需求提出了一种基于红外测温仪的发射率测量新方法,系统主要包括样品加热腔、发射率可调的红外测温仪和表面热电偶温度计。通过调节红外测温仪的发射率设置值,与样品本身的发射率进行匹配,当测量温度与真实温度值相等时,可直接得出样品的发射率。利用该系统测量了室温~200℃下,几种典型涂料与远红外纺织品样品8~14μm波段的发射率,得出其在近环境温度下发射率随测量温度的变化情况。搭建了基于能量法发射率测量系统,包括样品加热腔、参考黑体、红外测温仪。将两种方法的测量结果进行对比,得到两种方法测量结果的符合性较好,同时结合两种方法的测量数据评价了以上几种样品的发射率性能。本文提出的基于红外测温仪的发射率测量方法具有测量速度快、测量成本低等优点,并可应用于现场的工程测量。
[Abstract]:The emissivity of materials is an important physical quantity reflecting the properties of thermal radiation of materials, and it can show the intensity of radiative ability of materials. The emissivity values of the same sample are different due to the different testing methods. Because emissivity is a kind of complex parameter, the complexity of its influencing factors brings the diversity of corresponding measurement techniques. At present, many measurement systems are expensive and the measuring conditions are very high. Therefore, it is necessary to study a method of emissivity measurement which can be applied to practical engineering. In this paper, the concepts of effective radiation, effective luminance temperature and effective spectral emissivity are proposed, and a new method of emissivity measurement based on infrared thermometer is proposed to meet the needs of emissivity measurement. The system mainly includes sample heating chamber, infrared thermometer with adjustable emissivity and surface thermocouple thermometer. The emissivity of the infrared thermometer is adjusted to match the emissivity of the sample itself. When the measured temperature is equal to the real temperature, the emissivity of the sample can be obtained directly. The emissivity of 814 渭 m band of several typical coatings and far-infrared textile samples at room temperature ~ 200 鈩，
本文编号：2313693
[Abstract]:The emissivity of materials is an important physical quantity reflecting the properties of thermal radiation of materials, and it can show the intensity of radiative ability of materials. The emissivity values of the same sample are different due to the different testing methods. Because emissivity is a kind of complex parameter, the complexity of its influencing factors brings the diversity of corresponding measurement techniques. At present, many measurement systems are expensive and the measuring conditions are very high. Therefore, it is necessary to study a method of emissivity measurement which can be applied to practical engineering. In this paper, the concepts of effective radiation, effective luminance temperature and effective spectral emissivity are proposed, and a new method of emissivity measurement based on infrared thermometer is proposed to meet the needs of emissivity measurement. The system mainly includes sample heating chamber, infrared thermometer with adjustable emissivity and surface thermocouple thermometer. The emissivity of the infrared thermometer is adjusted to match the emissivity of the sample itself. When the measured temperature is equal to the real temperature, the emissivity of the sample can be obtained directly. The emissivity of 814 渭 m band of several typical coatings and far-infrared textile samples at room temperature ~ 200 鈩，
本文编号：2313693
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