静电放电电磁脉冲辐射干扰分析与防护

发布时间：2018-03-17 14:23

本文选题：脉冲辐射　切入点：电磁兼容　出处：《南京师范大学》2017年硕士论文　论文类型：学位论文

【摘要】：静电放电(Electrostaticdischarge)对于用电设备来说是一种存在已久的严重近场干扰。近年来电子工业飞速发,不断朝着高速通讯、高度集成、微功耗的方向发展,这样的结果就是集成电路内的绝缘层壁变得越来越薄,甚至局部没有绝缘层,同时芯片内部的走线也变得越来越短,大大增加了敏感度。静电放电是一个产生高电压、大电流、强电磁场的过程。所产生的电流可以通过传导直接影响设备,电磁场可以通过辐射影响设备,虽然直到20世纪90年代才有研究者提出ESD辐射场的危害,然而ESD辐射场的危害却不可忽视,同样可以对关键的设备系统的硬件软件造成破坏,带来不可估量的后果。本文从理论与仿真和实验三方面着手,①详细介绍了静电放电的基本理论、静电放电电流的数学表示方法、静电放电实际测试平台的集总参数模型以及静电放电脉冲电磁场模型,全面分析了静电放电辐射从产生到耦合的每个关键步骤的特点、所包含的特征参数、以及相应国际标准验证方法,为之后ESD脉冲电磁辐射空间激励和响应比较试验与脉冲电磁辐射耦合试验建立了理论基础。②仿真方面论文中首先对有限元法基本原理进行了较为详细的描述介绍。然后利用以有限元法为基础的HFSS软件为基础,同时结合了 matlab为工具,对ESD发生器和常见电子器件进行仿真建模,并且模拟了 ESD的瞬态电流和瞬态场。本文从理论上分析了讨论了静电放电与电子系统之间的辐射耦合路径;③试验方面,通过尝试使用GTEM室来代替通常直接在静电放电抗扰度试验平台,这种方式利用GTEM室充当传输线减小了空间中噪声对试验的干扰,并且相比较之下从GTEM室芯板发射出的脉冲电磁场场强更加均匀,线性程度更好;接着在本文中给出了标准传输线模型,并按照此模型设计了电磁场辐照试验,模拟了系统设备内部模块受到脉冲电磁场辐射照射时的耦合电压情况,并且分析了不同条件对于耦合电压的影响;④最后利用研究所得结论对几种实际电子产品的电磁兼容问题按照静电放电辐射的处理方法做出了适当处理使得电子产品通过了国家电磁兼容静电放电抗扰度标准测试。
[Abstract]:Electrostatic discharge (ESD) is a serious near field interference for electric equipment. In recent years, the electronic industry has been developing rapidly, and has been developing towards high speed communication, high integration and low power consumption. The result is that the insulation layer inside the integrated circuit becomes thinner and thinner, even if there is no insulation, and the wiring inside the chip becomes shorter and shorter, which greatly increases the sensitivity. The process of a strong electromagnetic field. The resulting current can directly affect the device through conduction, and the electromagnetic field can be affected by radiation, although it was not until 1990s that some researchers suggested the harm of the ESD radiation field. However, the harm of ESD radiation field can not be ignored, and it can also destroy the hardware and software of the key equipment system. This paper introduces the basic theory of electrostatic discharge and the mathematical expression method of electrostatic discharge current from three aspects of theory, simulation and experiment. The lumped parameter model of ESD test platform and the ESD pulse electromagnetic field model are analyzed. The characteristics of each key step of ESD radiation from generation to coupling are analyzed. And the corresponding international standard verification methods, For the purpose of comparing the spatial excitation and response of ESD pulse electromagnetic radiation with the pulsed electromagnetic radiation coupling test, the theoretical foundation .2 the basic principle of finite element method is described in detail in this paper. And then using the HFSS software based on the finite element method, At the same time, with matlab as the tool, the ESD generator and common electronic devices are simulated and modeled. The transient current and transient field of ESD are simulated. In this paper, the radiation coupling path between electrostatic discharge and electronic system is discussed theoretically. In this way, the GTEM cell is used as the transmission line instead of the normal test platform for ESD immunity test, which reduces the noise interference to the test in space. Compared with the GTEM chamber core panel, the pulse electromagnetic field field intensity is more uniform and the linearity is better. Then, the standard transmission line model is given, and the electromagnetic field irradiation test is designed according to the model. The coupling voltage of the internal module of the system under the radiation of pulsed electromagnetic field is simulated. The influence of different conditions on the coupling voltage is analyzed. Finally, by using the conclusion of the study, the EMC problem of several practical electronic products is treated properly according to the method of electrostatic discharge radiation. The product has passed the national electromagnetic compatibility electrostatic discharge immunity standard test.
【学位授予单位】：南京师范大学
【学位级别】：硕士
【学位授予年份】：2017
【分类号】：TN03;O441

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