激光脉冲串对电荷耦合器件积累损伤效应研究

发布时间：2018-04-20 15:55

本文选题：脉冲激光 + 损伤机理　；参考：《红外与激光工程》2017年10期

【摘要】：为了研究激光脉冲串对光电系统的损伤和致盲机理,开展了重频纳秒激光对黑白行间转移相机电荷耦合器件的损伤实验研究。实验结果表明:存在两种积累损伤效应机理,多个脉冲到达CCD靶面同一位置的损伤或致盲具有积累效应,多个脉冲积累损伤能够显著降低线损伤和全靶面损伤阈值,降低程度与脉冲个数、激光到靶能量密度有关。致盲机理与单脉冲致盲机理相同,均表现为器件垂直转移电路间及地间的短路;而激光脉冲串到达CCD靶面的不同位置也能够实现器件的功能性失效,其机制与单脉冲损伤显著不同,仅表现为线损伤的叠加,并未造成器件电路紊乱,功能性损伤阈值即对应线损伤阈值660 mJ/cm~2,而小于单次致盲阈值1 500~2 200 mJ/cm~2。
[Abstract]:In order to study the damage and blinding mechanism of laser pulse train to photoelectric system, the damage experiment of charge coupled device of black and white interline transfer camera by nanosecond laser with repetition frequency was carried out. The experimental results show that there are two mechanisms of cumulative damage. The damage or blindness caused by multiple pulses reaching the same position on the target surface of CCD has accumulative effect, and the damage threshold of line damage and the whole target surface can be significantly reduced by multiple pulse accumulation damage. The degree of reduction is related to the number of pulses and the energy density from laser to target. The blinding mechanism is the same as that of monopulse blinding, both of which are short circuit between the vertical transfer circuits and the ground, and the functional failure of the device can be realized when the laser pulses arrive at different positions of the CCD target. The mechanism is obviously different from that of single pulse damage, which is only the superposition of line damage and does not cause the circuit disorder. The functional damage threshold is 660 MJ / cm ~ (2) corresponding to the line damage threshold, but less than 1 500 ~ 2 200 mJ / cm ~ (2) of single blinding threshold.
【作者单位】：中国科学院长春光学精密机械与物理研究所激光与物质相互作用国家重点实验室;
【基金】：激光与物质相互作用国家重点实验室自主基金课题(SKLLIM-1503) 光电对抗测试评估技术重点实验室开放课题(GKCP2016004)
【分类号】：TN386.5

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