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基于MSP430的半导体器件测试设备的设计

发布时间:2018-04-22 14:39

  本文选题:PNP三极管 + NPN三极管 ; 参考:《兰州交通大学》2015年硕士论文


【摘要】:功率半导体器件是电子技术的主要组成部分。自1956年晶闸管发明以来,制造生产出大量的半导体器件。功率半导体器件在日常生活中应用十分广泛,是电子设备中的必要元件。目前,在电子工业中主要的半导体器件有BJT、MOSFET、IGBT以及IGCT,主要应用于高压、快速切换、高频等。相对于硅材料,碳化硅材料使得半导体器件的性能得到较大提高。半导体器件是每个电子设备不可或缺的部分,大部分电子设备的异常是由半导体器件的损坏或者其他原因造成的。如果是半导体器件的原因,则需要对其进行更换。由于电子设备种类繁多,如果知道半导体器件的型号,则容易进行更换,如果没有半导体器件的任何数据,则难于更换。基于这一问题,设计了一种半导体测试设备。本文使用两个开关对半导体器件进行测量:一个开关被用于分离微控制器的上拉电阻。我们可以关闭所述销的使用另一个开关的输出。输出取决于另一个开关,也可用于控制上拉电阻。这两个开关的状态不能在同一时间工作,会交替处于工作状态。所述半导体器件的三个测试终端具有三个引脚的微控制器中的一个连接。每个检测终端的状态可以改变为输出,并以同样的方式将其与电源以及接地端连接。以另一种方式,它们与680K、470K或通过地面、电源连接,此方法被用于正引脚。同一标准用于测试终端的负状态。第三端子销也被称为测试引脚,可以是开放式或连接在同一正、负引脚上.它由两部分组成:硬件部分和软件部分。在硬件部分,我们设计了一块PCB板。选用Altium Designer软件设计电路图和PCB.首先,论文中所画示意图为本次课题的研究项目,并确认了所有的模拟连接,完成所有连接后进行PCB设计。在PCB设计中,在不影响其它部件连接方式的基础上,并避免热、电磁的影响,在项目中采用16×2液晶显示器。液晶屏被用于applications.LCD等电子设备中,不但经济且易于编程、显示动画等。16×2的液晶屏可以每行显示16个字符,并可双行显示。在两行中,每个字符是由5x7像素矩阵组成。论文中设计了大量的电路图和PCB库。市场上有各种微处理器,我们选用低功耗的MSP430F132,它有混合信号处理能力、16位处理器、16位地址和数据总线;32KHz CPU、多种外设由于DCO快速重启功能等。该设备可由9V电池运行。论文中使用了两个电压调节器。由于除MSP430,所有部件需要在5V电压下工作,因此其中一个调节器(LM7805)用于将9V电压转换为5V;另一个调节器(AM1117)被用于将5V电压转换为3V。MSP430的工作电压超过3V时会损坏。焊接工作是在实验室完成的,PCB的大小为800mmX500mm,硬件的详细信息见后面章节。在软件部分,主要是对MCU的编程和调试。以IAR Embedded Workbench为开发环境,采用C语言编程,使用MSP-FET430UIF作为PC接口,其仿真功能强大,可以快速启动MSP430微控制器并应用于程序的开发。软件中的USB调试工具被用于MSP430的编程,其调试系统具有JTAG接口、间谍碧-Wire协议的辅助,通过它可以抹去闪存和程序新代码。由于MSP430的兼容性问题,不能使用USB接口。在这两部分内容完成之后,我们进行了一些功能性测试以保证PCB板没有任何问题.这些测试包括I/O功能的测试、振荡器测试和外设测试。对于I/O功能的测试,我们通过发送一些简单的代码检查所有的引脚。这一系列的测试是检查所有引脚的连接性,并确保在PCB板上的两个或更多的引脚之间没有交叉连接。在振荡器测试中,代码的写入用于启用和禁用外部晶体振荡器的使用。在外围测试中,代码用于激活设备以及测试。这些代码来自于MSP430的代码示例。经过测试后该板可以进行测量了。它可以自动识别NPN和PNP晶体管、计算电流放大系数和基极-发射极电压阈值并将其显示于LCD显示屏。采用同样的方式,它还可以识别N型和P型MOSFET,计算栅阈值电压和栅容量。关断电流约为20nA。
[Abstract]:Power semiconductor devices are the main components of electronic technology. Since the invention of the thyristor in 1956, a large number of semiconductor devices have been produced and produced. Power semiconductor devices are widely used in daily life and are essential components in electronic devices. At present, the main semiconductor devices in the electronic industry are BJT, MOSFET, IGBT and IGCT. It is mainly used in high voltage, fast switching, high frequency and so on. Relative to silicon material, silicon carbide materials make the performance of semiconductor devices greatly improved. Semiconductor devices are an indispensable part of every electronic device. Most of the electronic devices are caused by the damage of semiconductor devices or other reasons. Because of the wide variety of electronic devices, if the type of semiconductor device is known, it is easy to replace. If there is no data of the semiconductor device, it is difficult to replace. Based on this problem, a semiconductor testing device is designed. This paper uses two switches to measure semiconductor devices. A switch is used to separate the pull resistance of the microcontroller. We can close the output of the use of the other switch of the pin. The output depends on another switch and can be used to control the pull resistance. The state of the two switches can not work at the same time and will be in the working state alternately. The three test end of the semiconductor device is final. A connection in a microcontroller with three pins. The state of each detection terminal can be changed to output and connected to the power supply and the ground end in the same way. In another way, they are connected to the 680K, 470K, or through the ground, and the method is used by the Yu Zheng pin. The same standard is used to test the negative state of the terminal. The third terminal pin is also called the test pin, which can be open or connected to the same positive and negative pins. It consists of two parts: hardware and software parts. In the hardware part, we have designed a PCB board. Altium Designer software is used to design the circuit diagram and PCB. first, the drawings in this paper are the research projects of this subject, In the design of PCB, 16 x 2 liquid crystal displays are used in the project, and the LCD screen is used in applications.LCD isoelectric devices. It is not only economical and easy to program, but also is easy to program and display animation. The.16 * 2 LCD screen can display 16 characters per line and double line display. In the two line, each character is made up of a 5x7 pixel matrix. A large number of circuit diagrams and PCB libraries are designed in this paper. There are various microprocessors in the market. We choose low power MSP430F132, it has mixed signal processing capability, 16 bit processor, 16 bit address and number. According to the bus; 32KHz CPU, a variety of peripherals can be run by the DCO fast restart function. The device can be run by a 9V battery. In this paper, two voltage regulators are used. Because except MSP430, all parts need to work under the 5V voltage, so one of the regulators (LM7805) is used to convert the 9V voltage to 5V; the other regulator (AM1117) is used for 5V voltage. The work voltage conversion to 3V.MSP430 is damaged when the voltage exceeds 3V. The welding work is done in the laboratory, the size of the PCB is 800mmX500mm, the details of the hardware are seen in the following section. In the software part, the programming and debugging of the MCU is mainly used. IAR Embedded Workbench is used as the development environment, the C language programming is used, and MSP-FET430UIF is used as PC interface. It has powerful simulation function and can quickly start the MSP430 micro controller and apply it to program development. The USB debugging tool in the software is used in MSP430 programming. The debugging system has the JTAG interface and the assistant of the spy blue -Wire protocol. Through it, the flash memory and the new code of the program can be erased. Because of the compatibility problem of MSP430, the USB interface can not be used. After the completion of these two parts, we have done some functional tests to ensure that there are no problems with the PCB board. These tests include the I/O function test, the oscillator test and the peripherals test. For the I/O function test, we check all pins by sending some simple code. This series of tests is to check all the references. The connectivity of the foot, and ensures no cross connection between two or more pins on the PCB board. In the oscillator test, the code is written to enable and disable the use of the external crystal oscillator. In the peripheral test, the code is used to activate the device and test. The code comes from the code example of the MSP430. After the test, the plate is tested. It can be measured. It can automatically identify the NPN and PNP transistors, calculate the current amplification factor and the base emitter voltage threshold and display it on the LCD display. In the same way, it can also identify the N and P MOSFET, calculate the gate threshold voltage and gate capacity. The shut off flow is about 20nA..

【学位授予单位】:兰州交通大学
【学位级别】:硕士
【学位授予年份】:2015
【分类号】:TN303

【共引文献】

相关期刊论文 前1条

1 邓永辉;谢刚;汪涛;盛况;;A novel 4H-SiC lateral bipolar junction transistor structure with high voltage and high current gain[J];Chinese Physics B;2013年09期



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