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基于J750的DisplayPort接收芯片的测试系统设计及实现

发布时间:2018-05-11 07:58

  本文选题:集成电路芯片 + 测试 ; 参考:《中国科学院大学(工程管理与信息技术学院)》2015年硕士论文


【摘要】:DisplayPort是一种高速差分数据信号传输标准,主要用于高清视频信号的传输,由视频电子标准协会制订于2006年5月。在短短几年的时间里,DisplayPort发展非常迅速,赢得了众多业界巨头的支持,尤其是DisplayPort接收芯片的出货量与日剧增,其量产测试方案也逐渐成为一个主要的研究课题。本文正是针对这一课题,提出一种将板级系统跟测试机相结合的思想,选用量产测试中通用的低成本J750测试机台,通过对其承载板的重新设计,使之成为一种特殊的板级功能测试系统,从而既能满足高覆盖率的要求,又能符合低成本的考量。本论文完成的主要工作包括以下几个方面:(1)充分考虑了量产测试的一般要求跟DisplayPort接收信号测试的特殊需求,并从经济角度出发提出一种将SLT跟ATE测试结合在一起的测试方法,规划出了基于J750测试机的测试系统整体设计思路。(2)设计并实现了搭载SLT测试系统的承载板,既符合J750测试机的尺寸要求,也满足DisplayPort信号的布局布线要求,并搭配了合适的元器件从而可以很好的兼容SLT跟ATE两种测试方式。(3)基于IG-XL软件开发出了本系统适用的测试向量跟测试程序,可以控制ATE实现兼容SLT的测试方法。(4)设计并实施了针对本系统的验证试验,试验结果显示测试数据跟测试时间都满足预期的要求,证明本系统可以充分实现量产测试中高覆盖率跟低成本的要求。本系统是业界第一次将DisplayPort接收功能的测试应用在低成本的J750测试机台上,并可以在量产测试行业中推广。对于各种具有DisplayPort接收功能芯片,本系统都可以为其提供一种更可靠、更有效、更经济的测试解决方案,具有更高的生产价值跟实用性。
[Abstract]:DisplayPort is a high-speed differential data signal transmission standard, mainly used for high-definition video signal transmission, developed by the Video Electronic Standards Association in May, 2006. In a few short years, DisplayPort has developed very quickly, and won the support of many industry giants, especially the quantity and daily increase of DisplayPort receiving chip, and its mass production test scheme has gradually become a major research topic. In order to solve this problem, this paper presents an idea of combining board level system with test machine, and selects a low cost J750 test machine, which is used in mass production testing, and redesigns its bearing board. It becomes a special board level function test system, which can not only meet the requirements of high coverage but also meet the requirements of low cost. The main work of this thesis includes the following aspects: 1) considering the general requirements of mass production testing and the special requirements of DisplayPort receiving signal testing, and from the economic point of view, a test method combining SLT and ATE testing is proposed. The overall design idea of the test system based on J750 test machine is designed and the load board carrying SLT test system is designed and implemented. It not only meets the size requirement of J750 tester, but also meets the layout and wiring requirements of DisplayPort signal. And with the appropriate components so that it can be very good compatibility between SLT and ATE test methods. 3) based on the IG-XL software developed the system applicable test vector and test program, The test method that can control ATE to realize compatible SLT is designed and implemented. The test results show that both the test data and the test time meet the expected requirements. It is proved that this system can fully meet the requirements of high coverage and low cost in mass production testing. This system is the first time that the DisplayPort receiving function test is applied to the J750 test machine platform with low cost, and can be popularized in the mass production testing industry. This system can provide a more reliable, more effective and more economical test solution for various chips with DisplayPort receiving function, and has higher production value and practicability.
【学位授予单位】:中国科学院大学(工程管理与信息技术学院)
【学位级别】:硕士
【学位授予年份】:2015
【分类号】:TN407

【参考文献】

相关硕士学位论文 前1条

1 甘甜;基于Teradyne J750测试平台的射频芯片低成本测试方案开发及实现[D];复旦大学;2010年



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