基于失败向量信息的难测固定故障测试向量生成

发布时间：2018-06-09 01:40

本文选题：难测固定故障 + 测试向量生成　；参考：《微电子学与计算机》2017年04期

【摘要】：针对数字电路中难测固定故障测试向量生成效率低的问题,基于失败向量信息实现难测固定故障的测试向量生成.该方法利用难测固定故障失败向量与成功向量在端口逻辑值上可能具有的相反属性,以输入端口逻辑值的概率信息量化失败向量的特征,从而提高难测固定故障成功测试向量生成的生成概率,缩小测试向量的搜索范围,提高了测试向量生成的效率.
[Abstract]:In order to solve the problem of low efficiency in generating test vector of difficult fixed fault in digital circuit, the test vector generation of difficult fixed fault is realized based on the information of failure vector. This method quantifies the characteristics of the failure vector by using the opposite attributes of the failure vector and the success vector on the port logic value, which can be used to input the probability information of the port logic value. Thus, the probability of generating test vector is improved, the search range of test vector is reduced, and the efficiency of test vector generation is improved.
【作者单位】：西安交通大学电子与信息工程学院;中国电子科技集团公司第四十一研究所;
【分类号】：TN79

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