低成本片上射频内建自测系统的关键参数测量

发布时间：2018-06-27 10:52

本文选题：射频内建自测 + 坐标旋转数字计算机　；参考：《西安电子科技大学学报》2017年04期

【摘要】：针对芯片射频测试成本不断提高的问题,提出了一种低成本片上系统射频内建自测电路结构及其关键参数测量处理方法.此射频内建自测结构着重利用片上已有数字信号处理器、坐标旋转数字计算机和模数转换器对射频测试信号进行数字傅里叶变换,并利用低成本结构进行对数计算得到相应的信噪比.另外,该自测结构利用环回结构设计,将射频部分产生的信号用来作为测试信号而避免了外部噪声的干扰.这种射频内建自测方法已经成为一种有效的、低成本的设计方法,并用于新产品的量产.相对于以往的射频测试方法,该方法有效地减小了额外的硬件开销,在保证测试质量的情况下,降低了射频电路的测试成本.
[Abstract]:In order to solve the problem that the cost of RF test on chip is increasing continuously, this paper presents a low cost RF built-in self-test circuit structure and its key parameter measurement and processing method in a low cost on-chip system. This RF built-in self-test structure focuses on digital Fourier transform of RF test signal using existing digital signal processor on chip, coordinate rotating digital computer and analog-to-digital converter. The signal-to-noise ratio (SNR) is obtained by using the low cost structure to calculate the logarithm. In addition, the loop structure is used to design the self-testing structure, and the RF signal is used as the test signal to avoid the external noise interference. This RF built-in self-test method has become an effective, low-cost design method and used in mass production of new products. Compared with the previous RF testing methods, the proposed method can effectively reduce the additional hardware overhead and reduce the test cost of RF circuits under the condition of ensuring the test quality.
【作者单位】：西安电子科技大学微电子学院;
【基金】：国家自然科学基金资助项目(61376099,11235008)
【分类号】：TN407

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