一种光信号处理芯片测试技术研究

发布时间：2018-06-28 11:13

  本文选题：光信号处理 + 红外接收　； 参考：《电子与封装》2016年12期

【摘要】：介绍了一种光信号处理芯片的测试技术,该芯片通常用于红外接收系统中,对接收到的光信号进行处理后发送到系统的数字芯片中。测试时需要输入ASK调制信号,文中通过单片机产生测试信号以取代信号发生器,有效节约了成本。该芯片内部有放大器、带通滤波器、比较器等部分,重点介绍了功能部分和带通滤波器参数的测试,包括产生测试信号的方法,如何对单片机产生的信号进行处理,以及带通滤波器中心频率的测试和修调方法。
[Abstract]:This paper introduces a testing technique of optical signal processing chip. The chip is usually used in infrared receiving system. The received optical signal is processed and sent to the digital chip of the system. It is necessary to input ask modulation signal when testing. In this paper, the test signal is generated by single chip computer to replace the signal generator, and the cost is saved effectively. There are amplifiers, bandpass filters, comparators and so on in the chip. This paper mainly introduces the function part and the testing of the band-pass filter parameters, including the method of generating the test signal, and how to process the signal generated by the single-chip computer. And the measurement and modification of the center frequency of the band-pass filter.
【作者单位】： 中国电子科技集团公司第58研究所;
【分类号】：TN407
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本文编号：2077806