星载抗辐射CMOS多功能控制芯片的综合测试系统设计
发布时间：2018-07-17 04:45
【摘要】：为了评估星载相控阵T/R组件的电性能、温度传感器及通道一致性温度补偿功能和抗单粒子效应能力,本文针对星载X波段T/R组件中一款自主研发的CMOS多功能控制芯片,设计开发了一套基于PXI总线的综合测试系统。系统采用高速数字I/O技术,提高了芯片电性能测试速度;同时系统具备高精度自动温度测试功能,能够精确评估芯片温度传感器性能;另外系统集成了单粒子效应测试功能,能够实时监测并记录芯片试验过程中参数变化情况,同时具备数据自动处理功能,能够完成芯片电性能测试数据和设计指标的比对、温度测试数据和标定温度的误差分析以及单粒子效应试验前后数据变化量统计。最后采用本系统对芯片电性能、温度传感器、温度补偿和抗单粒子效应能力进行了实测分析,测试结果表明该芯片功能正常、性能良好,可用于温度剧烈变化和充满空间辐射的航天环境,同时测试系统具备操作简单、可移植性好、测试速度快和测试精度高等优势。
[Abstract]:In order to evaluate the electrical performance of spaceborne phased array T / R module, the temperature compensation function of temperature sensor and channel consistency, and the ability to resist single particle effect, this paper focuses on a self-developed CMOS multifunctional control chip in spaceborne X band T / R module. A comprehensive test system based on PXI bus is designed and developed. The system adopts high-speed digital I / O technology to improve the testing speed of the chip's electrical performance. At the same time, the system has the function of high precision automatic temperature measurement, which can accurately evaluate the performance of the chip's temperature sensor. In addition, the system integrates the function of single particle effect test. It can monitor and record the change of parameters in the process of chip test in real time, at the same time, it has the function of automatic data processing, and can complete the comparison between the test data and the design index of the chip electrical performance. Error analysis of temperature test data and calibration temperature and statistics of data change before and after single particle effect test. Finally, the electrical performance, temperature sensor, temperature compensation and anti-single particle effect ability of the chip are measured and analyzed by the system. The test results show that the chip has normal function and good performance. It can be used in spaceflight environment with drastic change of temperature and full of space radiation. At the same time, the test system has the advantages of simple operation, good portability, high test speed and high precision.
【学位授予单位】：浙江大学
【学位级别】：硕士
【学位授予年份】：2017
【分类号】：TP274;TN407
本文编号：2129070
[Abstract]:In order to evaluate the electrical performance of spaceborne phased array T / R module, the temperature compensation function of temperature sensor and channel consistency, and the ability to resist single particle effect, this paper focuses on a self-developed CMOS multifunctional control chip in spaceborne X band T / R module. A comprehensive test system based on PXI bus is designed and developed. The system adopts high-speed digital I / O technology to improve the testing speed of the chip's electrical performance. At the same time, the system has the function of high precision automatic temperature measurement, which can accurately evaluate the performance of the chip's temperature sensor. In addition, the system integrates the function of single particle effect test. It can monitor and record the change of parameters in the process of chip test in real time, at the same time, it has the function of automatic data processing, and can complete the comparison between the test data and the design index of the chip electrical performance. Error analysis of temperature test data and calibration temperature and statistics of data change before and after single particle effect test. Finally, the electrical performance, temperature sensor, temperature compensation and anti-single particle effect ability of the chip are measured and analyzed by the system. The test results show that the chip has normal function and good performance. It can be used in spaceflight environment with drastic change of temperature and full of space radiation. At the same time, the test system has the advantages of simple operation, good portability, high test speed and high precision.
【学位授予单位】：浙江大学
【学位级别】：硕士
【学位授予年份】：2017
【分类号】：TP274;TN407
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