支持IEEE1149.7标准的边界扫描控制器的设计与研究
发布时间：2018-10-20 20:40
【摘要】：为解决复杂芯片的测试与调试问题,提出支持IEEE 1149.7标准的边界扫描控制器。在对IEEE 1149.7标准和边界扫描测试技术进行深入研究的基础上,利用上位机进行软件编程,通过QuartusⅡ平台进行IP核的开发,成功设计出了支持IEEE 1149.7标准的边界扫描测试控制器。实验结果表明,控制器能够产生符合IEEE 1149.7标准的两线星型信号和四线输出信号。
[Abstract]:In order to solve the problem of testing and debugging complex chips, a boundary scan controller supporting IEEE 1149.7 is proposed. On the basis of deep research on IEEE 1149.7 standard and boundary scan test technology, a boundary scan test controller supporting IEEE 1149.7 standard is successfully designed by using upper computer to program software and developing IP core through Quartus 鈪，
本文编号：2284337
[Abstract]:In order to solve the problem of testing and debugging complex chips, a boundary scan controller supporting IEEE 1149.7 is proposed. On the basis of deep research on IEEE 1149.7 standard and boundary scan test technology, a boundary scan test controller supporting IEEE 1149.7 standard is successfully designed by using upper computer to program software and developing IP core through Quartus 鈪，
本文编号：2284337
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