基于NBTI效应的数字型高精度老化监测电路设计

发布时间：2018-10-21 11:58

【摘要】：随着晶体管特征尺寸的减小,负偏压温度不稳定性(negative bias temperature instability,NBTI)已经成为影响电路老化的关键因素,准确地衡量老化程度是抗老化设计前提条件。通过对NBTI效应和老化监测原理的研究,提出一种数字型高精度老化监测电路方案。首先,利用两个结构相同的压控振荡器(voltage controlled oscillator,VCO)产生基准频率f0和老化频率fx;然后,采用等精度测量将老化频率与基准频率进行对比,结合放大因子等方法降低截断误差,达到高精度监测的目的。实验结果表明,在1.2 V电源电压27℃下监测电路的精度可达到0.02%。
[Abstract]:With the reduction of the characteristic size of transistors, the negative bias temperature instability (negative bias temperature instability,NBTI) has become the key factor to affect the aging of the circuit. The accurate measurement of the aging degree is the precondition of anti-aging design. Based on the study of NBTI effect and aging monitoring principle, a digital high precision aging monitoring circuit is proposed. First, two voltage-controlled oscillator (voltage controlled oscillator,VCO) with the same structure are used to generate the reference frequency f _ 0 and the aging frequency fx;. Then, the aging frequency is compared with the reference frequency by the equal precision measurement, and the truncation error is reduced by combining the amplification factor and other methods. To achieve the purpose of high precision monitoring. The experimental results show that the precision of the monitoring circuit can reach 0.02 鈩，

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