空间静电放电对集成运算放大器的干扰影响模拟试验研究

发布时间：2018-10-26 18:37

【摘要】：航天器充电效应导致的空间静电放电(SESD)作用于星载电子设备会使敏感电路和器件产生各种"软错误",最终可能导致设备或系统异常甚至整星失效.目前,关于SESD对空间电子设备,尤其是对星用器件的影响研究较少.本文选取典型的模拟电路LM124集成运算放大器为研究对象,利用ESD发生器模拟空间静电放电对该器件的常用4种工作模式进行了辐射干扰试验,并利用信号发生器对器件输入端进行了正弦波干扰注入测试.模拟的SESD干扰试验结果表明,运放输出端在放电干扰下会产生异常瞬态脉冲,脉冲特征与器件的工作模式、偏置条件和放电电压有关.电压比较器只出现单一极性的输出瞬态脉冲,电压跟随器与同相放大器对ESD的响应类似,而反相放大器对ESD的敏感度相对较低.正弦波干扰注入测试结果表明,输出瞬态脉冲的幅度、脉宽与输入端干扰信号的幅度和频率之间存在明显的相关性.此工作对于深入研究各类星用典型器件对SESD干扰的响应规律,了解SESD导致航天器电子设备或系统在轨故障的机制,进而在电路层次采取有针对性的防护措施具有借鉴意义.
[Abstract]:The space electrostatic discharge (SESD) caused by the charge effect of spacecraft will cause a variety of "soft errors" in the sensitive circuits and devices when acting on the spaceborne electronic equipment, which may eventually lead to abnormal equipment or system or even failure of the whole satellite. At present, there is little research on the influence of SESD on space electronic equipment, especially on satellite devices. In this paper, the typical analog circuit LM124 integrated operational amplifier is chosen as the research object, and the radiation interference test is carried out by using the ESD generator to simulate the space electrostatic discharge. The sinusoidal interference injection test is carried out on the input end of the device by using the signal generator. The simulated SESD interference test results show that an abnormal transient pulse is generated at the output end of the amplifier under discharge interference. The characteristics of the pulse are related to the operating mode of the device, the bias condition and the discharge voltage. The voltage comparator only has a single polarity output transient pulse, and the voltage follower is similar to the in-phase amplifier in response to ESD, while the inverse amplifier has a relatively low sensitivity to ESD. The test results of sinusoidal interference injection show that there is an obvious correlation between the amplitude and width of the output transient pulse and the amplitude and frequency of the interference signal at the input end. This work can be used as a reference for studying the response law of typical satellite devices to SESD interference, understanding the mechanism of spacecraft electronic equipment or system fault caused by SESD, and taking targeted protective measures at the circuit level.
【作者单位】：中国科学院国家空间科学中心;中国科学院大学;
【基金】：国防基础科研计划(编号:Y56701A34S) “十三五”装备预研领域基金(编号:Y5BZ18AI80)资助项目
【分类号】：V443;TN722.77

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