高压快速软恢复二极管研究
[Abstract]:With the development of power devices in the direction of large capacity and high frequency, more stringent requirements have been put forward for the continuous current diodes. Silicon is one of the most abundant materials in nature. Silicon-based power devices will remain a mainstream device for a long time. Therefore, it is of practical significance and practical value to study the fast soft recovery technology of silicon based power diode, to further optimize or improve the device structure, and to obtain satisfactory reverse recovery characteristics in application. In this paper, the principle of reverse recovery characteristics of silicon based power diode is briefly analyzed, and the key to obtain soft turn-off characteristic is to realize the reverse distribution of carriers in the device. On this basis, a structure of field charge extraction diode is proposed. The structure improves the cathode and introduces P layer into the cathode. At the end of turn-off, the P part of the cathode is injected into the hole through the action of the electric field inside the device. The change rate of reverse recovery current is slowed down and the soft turn-off characteristic is obtained. The parameters that characterize the reverse recovery characteristics of power diodes are briefly introduced. Then, the structure design of the field charge extraction diode is discussed in detail, and the relationship between the reverse recovery characteristic and the structure of the device is discussed theoretically, and the mathematical formula between them is given. Based on this, a field charge decimation diode structure of 150A/1200V is designed, and the forward, reverse blocking and dynamic switching characteristics of the device are verified by numerical simulation. The results show that the structure of field charge decimation diode can realize fast soft turn-off, and its turn-off loss is smaller than that of minority carrier diode. Then, the reverse recovery characteristics of the field charge decimation diode structure are further discussed, and the change of the reverse recovery characteristics of the device at low temperature and high commutation rate dtdi is discussed. The results show that the field charge decimation diode can still achieve soft turn-off under the above conditions and has a strong ability to resist dynamic avalanche. Finally, the structure parameters of the device are optimized to optimize the reverse characteristics of the device. On the basis of the structure research, the fabrication process of the field charge extraction diode device is further studied. Because the structure cathode of the device is relatively complex, a two-step diffusion method is proposed. The process flow of field charge extraction diode is designed and the whole process scheme is simulated by numerical simulation technology. The various characteristic parameters of the device are verified after the fabrication of the process. The results show that the various characteristic parameters of the device are in line with the expected design, which indicates that the process scheme is feasible. Finally, the research results of this paper have certain reference value and practical significance for the development and design of high voltage fast soft turn off diode.
【学位授予单位】:电子科技大学
【学位级别】:硕士
【学位授予年份】:2016
【分类号】:TN313.4
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