模拟测试交换格式的研究与实现
发布时间：2018-12-18 07:00
【摘要】：随着电子技术的飞速发展,电子产品领域的不断扩大,电子技术已经深入到航空、医疗、教育等各个方面,但是由于电路系统的不断更新,其结构也越来越复杂,这给电路测试、维护带来了更大的困难。仅仅依靠人为修复故障设备已经无法满足社会需求,尤其是军工、航空等领域,设备出现故障时需要迅速的定位与修复。 目前电路故障诊断系统主要分为电路仿真和后处理两大部分,电路仿真部分主要完成电路仿真、数据结果采集、知识处理等,后处理部分主要完成智能诊断和TPS测试执行,仿真和后处理之间的信息交互就显得十分重要。目前数字电路发展较快,其仿真系统和测试格式已经相当成熟,然而模拟电路由于其自身输入信号的连续性、不可穷举性,故障模型复杂等特点,致使故障诊断相对发展较慢,模拟测试交换格式(ATIF)至今没有一个标准。 为了提高自动测试系统对模拟电路故障诊断的效率和水平,本课题研究定义一种模拟测试的交换机制,为基于仿真测试程序集的开发和数据传递提供信息和数据格式。本文针对目前科研项目,对模拟故障电路诊断系统进行接口设计,研究电路仿真和后处理部分与AT工F数据之间的通信关系,制定AT工F文件的存储内容以及文件之间的相互关系,实现了交互数据的统一管理与调度。由于模拟电路故障复杂多变,为了保证ATIF数据的全面与测试的有效性,本文通过SPICE仿真引擎采用多激励注入对电路进行蒙特卡洛仿真分析,将仿真数据进行小波分析提取特征,并采用人工智能诊断算法BPN.SVM.AIS进行知识生成与评价。最终根据自定义的ATIF交换格式实现ATIF文件自动生成,最后用ATIF数据对一个模拟电路实例进行故障诊断,实验结果证明了模拟测试交换格的有效性。
[Abstract]:With the rapid development of electronic technology and the expansion of electronic products field, electronic technology has been deeply into aviation, medical treatment, education and other aspects, but because of the continuous updating of circuit system, its structure is becoming more and more complex. This brings greater difficulties to circuit testing and maintenance. It is impossible to meet the needs of the society only by artificial repair equipment, especially in the fields of military industry, aviation and so on. When the equipment breaks down, it needs to be located and repaired quickly. At present, the circuit fault diagnosis system is mainly divided into two parts: circuit simulation and post-processing. Circuit simulation mainly completes circuit simulation, data acquisition, knowledge processing and so on. The post-processing part mainly completes intelligent diagnosis and TPS test execution. The information interaction between simulation and post-processing is very important. At present, the digital circuit is developing rapidly, and its simulation system and test format have been quite mature. However, the analog circuit is relatively slow in fault diagnosis because of its characteristics of continuity of input signal, non-exhaustive, complex fault model, etc. The Analog Test Interchange format (ATIF) is not yet a standard. In order to improve the efficiency and level of the automatic test system for analog circuit fault diagnosis, this paper studies and defines an exchange mechanism of analog testing, which provides information and data format for the development and data transmission of simulation test assembly. According to the current scientific research project, this paper designs the interface of analog fault circuit diagnosis system, and studies the communication relationship between circuit simulation and post-processing part and AT data. The storage contents of AT files and the relationship between them are established, and the unified management and scheduling of interactive data are realized. Because the fault of analog circuit is complex and changeable, in order to ensure the validity of ATIF data and test, this paper uses multi-excitation injection to analyze the circuit through SPICE simulation engine, and carries out wavelet analysis to extract the features of the simulation data. And the artificial intelligence diagnosis algorithm BPN.SVM.AIS is used to generate and evaluate the knowledge. Finally, the automatic generation of ATIF files is realized according to the custom ATIF exchange format. Finally, an analog circuit example is diagnosed with ATIF data. The experimental results show that the simulation test switch lattice is effective.
【学位授予单位】：北方工业大学
【学位级别】：硕士
【学位授予年份】：2015
【分类号】：TN710
[Abstract]:With the rapid development of electronic technology and the expansion of electronic products field, electronic technology has been deeply into aviation, medical treatment, education and other aspects, but because of the continuous updating of circuit system, its structure is becoming more and more complex. This brings greater difficulties to circuit testing and maintenance. It is impossible to meet the needs of the society only by artificial repair equipment, especially in the fields of military industry, aviation and so on. When the equipment breaks down, it needs to be located and repaired quickly. At present, the circuit fault diagnosis system is mainly divided into two parts: circuit simulation and post-processing. Circuit simulation mainly completes circuit simulation, data acquisition, knowledge processing and so on. The post-processing part mainly completes intelligent diagnosis and TPS test execution. The information interaction between simulation and post-processing is very important. At present, the digital circuit is developing rapidly, and its simulation system and test format have been quite mature. However, the analog circuit is relatively slow in fault diagnosis because of its characteristics of continuity of input signal, non-exhaustive, complex fault model, etc. The Analog Test Interchange format (ATIF) is not yet a standard. In order to improve the efficiency and level of the automatic test system for analog circuit fault diagnosis, this paper studies and defines an exchange mechanism of analog testing, which provides information and data format for the development and data transmission of simulation test assembly. According to the current scientific research project, this paper designs the interface of analog fault circuit diagnosis system, and studies the communication relationship between circuit simulation and post-processing part and AT data. The storage contents of AT files and the relationship between them are established, and the unified management and scheduling of interactive data are realized. Because the fault of analog circuit is complex and changeable, in order to ensure the validity of ATIF data and test, this paper uses multi-excitation injection to analyze the circuit through SPICE simulation engine, and carries out wavelet analysis to extract the features of the simulation data. And the artificial intelligence diagnosis algorithm BPN.SVM.AIS is used to generate and evaluate the knowledge. Finally, the automatic generation of ATIF files is realized according to the custom ATIF exchange format. Finally, an analog circuit example is diagnosed with ATIF data. The experimental results show that the simulation test switch lattice is effective.
【学位授予单位】：北方工业大学
【学位级别】：硕士
【学位授予年份】：2015
【分类号】：TN710
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