数字电路抗老化方法研究

发布时间：2019-02-14 17:30

【摘要】：微电子技术的高速发展和工艺尺寸的持续减小,促使数字电路的可靠性受到严重的威胁。由NBTI (Negative Bias Temperature Instability)效应导致的老化在很大程度上影响到了数字电路的生命周期,使数字电路的性能退化。数字电路抗老化相关方法研究对保证数字电路可靠性已经显得尤为重要,本文以保证数字电路可靠性为出发点,重点针对数字电路的抗老化方法进行了研究,主要工作如下：1、详细地介绍了影响数字电路生命周期的老化效应,对其产生机理、数学模型和防护方法进行了详细分析。重点阐述了几种数字电路典型的静态老化防护方法,并分析了它们的优缺点。2、提出了一种考虑电路拓扑结构的老化关键门高效选择方法,精选出对电路老化最关键的门集合。克服了传统关键门选择方案时间开销大和对电路老化过度防护的两个问题,对ITC99和ISCAS标准电路的实验结果表明,在保证电路具有相同工作寿命的前提下,相比已有的关键门查找方法,本文方案查找效率平均提高了3.97倍,面积开销平均降低了27.21%。3、设计了一种基于晶体管开关特性的老化屏蔽单元,可以在电路动态运行过程中,有针对性地防护那些特定跳变延迟较大的关键门,从而减少关键路径的传输延迟,使其满足时序约束而不受老化的影响以致电路出现失效的危险。
[Abstract]:With the rapid development of microelectronics technology and the continuous decrease of process size, the reliability of digital circuits is seriously threatened. The aging caused by NBTI (Negative Bias Temperature Instability) effect greatly affects the life cycle of digital circuits and degrades the performance of digital circuits. The research on the anti-aging methods of digital circuits has become particularly important to ensure the reliability of digital circuits. In this paper, the anti-aging methods of digital circuits are studied with emphasis on the reliability of digital circuits. The main work is as follows: 1. The aging effect affecting the life cycle of digital circuits is introduced in detail. The generation mechanism, mathematical model and protection methods are analyzed in detail. In this paper, several typical static aging protection methods for digital circuits are described, and their advantages and disadvantages are analyzed. 2. An efficient selection method for aging critical gates considering circuit topology is proposed. Select the most critical set of gates for circuit aging. It overcomes the two problems of high time cost of traditional key gate selection scheme and over-protection against circuit aging. The experimental results of ITC99 and ISCAS standard circuits show that the circuit has the same working life under the premise that the circuit has the same working life. Compared with the existing key gate lookup methods, the efficiency of this scheme is increased by 3.97 times on average, and the area overhead is reduced by 27.21. 3. An aging shielding cell based on transistor switching characteristics is designed. In the course of dynamic operation of the circuit, the critical gates with large jump delay can be protected, thus the transmission delay of the critical path can be reduced, and the transmission delay of the critical path can be reduced so that the critical path can meet the timing constraints without the influence of aging, and the circuit will be at risk of failure.
【学位授予单位】：合肥工业大学
【学位级别】：硕士
【学位授予年份】：2015
【分类号】：TN79

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