辐射体的近场-远场变换研究
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图片说明:直角坐标系下的平面测量方法
[Abstract]:With the rapid development of modern science and technology, electronic equipment tends to be integrated and miniaturized more and more. The electronic devices containing all kinds of functions and functions in the same system will inevitably produce electromagnetic interference, and the materials used in modern times also tend to be lightweight. Although this material makes it easy to use and carry, compared with the traditional metal materials, its electromagnetic shielding ability is poor and easy to cause electromagnetic leakage. Under certain space constraints, when these equipment or systems work, especially those precision instruments, the requirements for the surrounding environment are very high, and the performance of these equipment or systems may be affected by the very small electromagnetic disturbance in the environment. On the other hand, once these electronic devices work with other devices, their unintentional electromagnetic waves may also cause other functions of the system to fail to function properly. These intentional or unintentional electromagnetic interference or electromagnetic leakage may still cause certain electromagnetic energy radiation over a long distance through radio wave propagation. The problem solved in this paper is to calculate the far field electric field limit value caused by the near field electric field of electronic equipment or system radiation, and to analyze the sampling method and sampling error analysis of near field test. Firstly, according to the principle of plane spectral expansion, the principle of near-field-far-field extrapolation is studied, and the expression of far-field electric field is obtained from the near-field radiation field. The coupling product and compensation method of near-field-far-field transformation are derived by using Rolentz (Lorentz) reciprocity principle. The influence of different sampling test intervals on the results obtained by near-field-far-field transformation algorithm is analyzed, which provides a theoretical basis for the subsequent numerical model analysis. Secondly, using the dipole array as the radiator simulation model, the near-field electric field value on the sampling test plane is brought into the near-field-far-field algorithm to obtain the expression of the simulated E-plane far-field electric field, and compared with the theory, it is found that the simulated pattern is consistent with the theoretical pattern in a certain error range. Considering the actual conditions, the influence of the ground on the radiation body is analyzed, and the influence of the near field radiation value at different heights on the far field radiation is discussed. Finally, the sampling error in the measurement process is analyzed, in which three kinds of error sources are discussed: random amplitude and phase measurement error, finite plane truncation error and probe positioning error. The influence of the error on the near field measurement data is analyzed, and then the influence on the far field electric field value is analyzed. For each error source, it is introduced into the simulation model, and the error values of different sizes are compared and analyzed, and the upper bound of the error is obtained, and the error compensation method is used to correct it.
【学位授予单位】:哈尔滨工业大学
【学位级别】:硕士
【学位授予年份】:2015
【分类号】:TN601
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