X射线荧光测井谱漂校正技术研究

发布时间：2018-03-29 07:38

本文选题：谱漂校正　切入点：X射线荧光测井　出处：《光谱学与光谱分析》2017年03期

【摘要】：X射线荧光测井技术是一种可以在井下原位进行元素定量(半定量)分析的测井技术,对矿产勘查具有重要意义。受井下温度影响,X射线荧光测井仪容易发生谱漂。X射线测井仪采用硬件进行稳谱,采用软件实现微小谱漂校正。X射线荧光测井的谱数据量大,难以采用人工校正的方法实现。文章在总结了X射线荧光测量专业人员进行谱漂校正经验的基础上,结合专家系统研究了X射线荧光测井谱漂的校正方法。在谱漂校正过程中,采用对散射本底变化不灵敏的对称零面积法进行自动寻峰,并用标准方差进行指示峰判别。利用先验知识(上一次能量刻度)和高斯概率密度函数对当前指示峰进行定性分析,确定指示峰能量。将指示峰峰位和定性分析获得的能量值采用最小二乘法进行拟合,获得能量刻度系数,并对偏离较大的数据进行筛选,达到能量自动刻度目的,实现X射线荧光测井仪器谱谱漂校正。文章采用所述的谱漂校正方法对某次X射线测井仪温度实验的322条谱线进行校正,结果表明该方法能够有效地自动校正X射线荧光测井仪谱漂。
[Abstract]:X-ray fluorescence logging (XRF) is a logging technique that can be used for element quantitative (semi-quantitative) analysis in situ. It is of great significance to mineral exploration. The X-ray fluorescence logging tool is easy to produce spectrum drift. The hardware is used to stabilize the spectrum, and the software is used to realize the correction of micro-spectrum drift. The spectrum data of X-ray fluorescence logging is large. It is difficult to use manual correction method. This paper summarizes the experience of X-ray fluorescence measurement professionals in spectral drift correction, and studies the correction method of X-ray fluorescence logging spectral drift based on expert system. In the process of spectral drift correction, The symmetrical zero area method, which is insensitive to the change of scattering background, is used to find the peak automatically, and the standard variance is used to distinguish the indicating peak. The qualitative analysis of the current indicating peak is carried out by using the prior knowledge (the last energy scale) and Gao Si's probability density function. The energy of indicating peak is fitted by least square method, the coefficient of energy calibration is obtained, and the deviation data are screened to achieve the purpose of automatic calibration of energy, so as to determine the energy of indicating peak, and the energy value obtained by qualitative analysis is fitted by the least square method, and the coefficient of energy calibration is obtained by means of least square method. The spectral drift correction of X-ray fluorescence logging tools is realized. In this paper, 322 spectral lines in a temperature experiment of an X-ray logging tool are corrected by using the proposed spectral drift correction method. The results show that this method can automatically correct the spectral drift of X-ray fluorescence logging tool.
【作者单位】：成都理工大学;浙江中控系统工程有限公司;
【基金】：国家自然科学基金项目(41204134) 国家(863)项目(2012AA061803) 国家重大科研装备研制项目[(ZDYZ2012-1)-07]资助
【分类号】：P631.81;O657.34

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