超高速并行光电模块的电子干扰以及传输信号的研究

发布时间：2018-05-07 16:20

本文选题：并行 + EMI　；参考：《上海交通大学》2014年硕士论文

【摘要】：信息传输速率的需求随着信息量的增加而增大,系统的要求越来越高,作为系统的子系统,超高速模块的诞生也成为大势所趋,随着技术的日渐成熟,并行模块逐步在短距离传输中崭露头角,并行模块成本低、易维护,是构建未来低成本,低能耗,高扩展性的光通信系统的必要部件。光模块在走向小型化,高速率,低功耗,低成本,传输距离远的同时,设计难度不断增加,测试难度和复杂度也随之增加。本文主要介绍超高速并行光模块的传输信号测试及EMI(Electromagnetic Interference)的测试。并行光模块测试的难点主要体现在两个方面。第一个方面,随着信号速率的提升,测试的难度和复杂度迅速提升。当信号速率达到25G时,传统的方法难以获得稳定的测试结果。本文提出了一种更加适用的方案,通过增加采集点,增加拟合次数,来提高灵敏度的测试精度。我们的实验结果表明,该测试方法不论在测试精度上还是测试时间上都有明显的效果。第二个方面,模块的小型化导致设计密度提高,EMI设计变得更为复杂,有效的测试对于降低设计成本,缩短设计周期尤为重要。本文提出了一种在研发阶段的预测试方法。测试设计费用相对低廉,容易实现,通过常规的设备进行简单的搭建就可实现,这样也就降低了模块研发过程中用于EMI测试的费用。不但提高了模块EMI测试一次成功的可能性,而且在市场竞争中也抢的先机。
[Abstract]:The demand of information transmission rate increases with the increase of the amount of information, and the requirement of the system becomes higher and higher. As the subsystem of the system, the birth of ultra-high speed module has become the trend of the times, and with the development of technology, Parallel modules are gradually emerging in short distance transmission. Parallel modules are low cost and easy to maintain. They are necessary components for building low cost, low energy consumption and high scalability optical communication system in the future. As the optical module moves towards miniaturization, high speed, low power consumption, low cost and long transmission distance, the design difficulty increases continuously, and the test difficulty and complexity also increase. This paper mainly introduces the transmission signal test and EMI(Electromagnetic interference test of ultra high speed parallel optical module. The difficulties of parallel optical module testing are mainly reflected in two aspects. First, with the increase of the signal rate, the difficulty and complexity of the test increase rapidly. When the signal rate reaches 25 G, it is difficult for the traditional method to obtain stable test results. In this paper, a more suitable scheme is proposed to improve the accuracy of sensitivity measurement by increasing the sampling points and fitting times. Our experimental results show that the method has obvious effect in both accuracy and time. In the second aspect, the miniaturization of the module makes the design of EMI more complex, and the effective test is very important to reduce the design cost and shorten the design cycle. In this paper, a pre-test method in R & D phase is proposed. The cost of test design is relatively low and easy to realize, which can be realized by simple construction of conventional equipment, which reduces the cost of EMI test in the process of module development. It not only improves the possibility of a successful EMI test, but also takes the lead in market competition.
【学位授予单位】：上海交通大学
【学位级别】：硕士
【学位授予年份】：2014
【分类号】：TN929.1

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