TD-LTE基站衰落自动化测试系统的设计与测试

发布时间：2018-08-17 19:57

【摘要】：第二代和第三代移动通信技术已经深入到人们的生活、办公、娱乐各个方面,作为第四代移动通信技术的LTE基站的质量和可靠性也越来越受到关注,尤其是TD-LTE基站的衰落性能。由于TD-LTE基站具有测试任务多,硬件接口比较多、需求变化快、使用环境多样和多测试终端等不确定等特点,测试工程师传统的手动测试技术和方法已无法适应TD-LTE基站衰落性测试的挑战,不能对TD-LTE基站衰落性测试进行作业流程的管理,无法满足基站衰落性测试的需要。上海贝尔公司开发和提供的测试平台EASYTEST是一个通用工具,提供了UMTS和LTE集成测试自动化解决方案。EASYTEST测试平台在TD-LTE基站基本功能测试中得到了广泛应用,但是对TD-LTE的基站衰落自动化测试还处于探索阶段,衰落自动化测试的需求尚未统一。如何建立和完善一个能够有效自动化的TD-LTE自动化测试系统,是TD-LTE基站衰落性测试急需解决的一个问题。本文基于TD-LTE基站衰落原理和EASYTEST技术,设计了一个基于TD-LTE基站衰落自动化测试系统。首先本文对TD-LTE基站衰落自动化测试的需求进行了分析,总结了当前问题,接着通过用例图、流程图等方法着重分析了UE自动介入、App server发数据包、选择衰落信道模型、获取海斯UE log、转换海斯UE log成csv文件、上传UE log的csv文件到log server、导入数据库以及重启基站的功能的业务流程和需求。接着,详细阐述了TD-LTE基站衰落自动化测试系统的系统架构;然后对衰落自动化测试系统最主要的三个子系统(下行衰落自动化测试子系统、上行衰落自动化测试子系统、上下行全衰落自动化测试子系统)进行了设计和实现。此外,本文详细描述了启动衰落模型子系统,上行、下行获取UE的log方式的方式,转换上行、下行的UE log到csv文件的功能,以及全衰落测试中建立专有承载等关键技术的实现方法。结合实际测试任务,本文设计了功能测试、关键功能测试、系统整合测试的测试用例,针对系统整合测试中出现的问题,进行了代码优化和调整。从测试结果看,系统的功能和性能能够满足当初设计的指标和要求。目前该系统已经应用于上海贝尔公司的TD-LTE基站衰落测试。系统运行结果表明,与传统的测试工程师手动测试相比,流程自动化程度达到90%以上,压力测试正确率达到99%以上,测试效率提高近7倍,测试速度加快,解放了测试工程师的精力和时间,同时也为项目管理者提供了更多的时间的便利。
[Abstract]:The second and third generation mobile communication technology has been deeply into people's life, office, entertainment, as the fourth generation of mobile communication technology, the quality and reliability of the LTE base station has been paid more and more attention, especially the fading performance of the TD-LTE base station. Because the TD-LTE base station has many testing tasks, more hardware interfaces, rapid change of requirements, various environments and many test terminals, etc. The traditional manual testing techniques and methods used by test engineers can not meet the challenge of TD-LTE base station fading test, nor can they manage the operation flow of TD-LTE base station fading test, nor can they meet the needs of base station fading test. EASYTEST, a testing platform developed and provided by Shanghai Bell Company, is a universal tool, which provides UMTS and LTE integrated test automation solution .EASYTEST test platform has been widely used in the basic function testing of TD-LTE base station. But the TD-LTE base station fading automation test is still in the exploration stage, and the requirement of the fading automation test is not unified. How to establish and perfect a TD-LTE automated test system which can be effectively automated is an urgent problem to be solved in TD-LTE base station fading test. Based on the principle of TD-LTE base station fading and EASYTEST technology, an automatic test system based on TD-LTE base station fading is designed in this paper. Firstly, this paper analyzes the requirements of TD-LTE base station fading automation test, summarizes the current problems, and then analyzes the UE automatic interference in the application server sending data packets through the use case diagram, flow chart and other methods, and selects the fading channel model. Get Hayes UE log, convert Hayes UE log into csv file, upload UE log csv file to log server, import database and reboot the business flow and requirement of base station function. Then, the system architecture of the TD-LTE base station fading automation test system is described in detail, and then the three main subsystems (downlink fading automation test subsystem, uplink fading automatic test subsystem) of the fading automation test system are introduced. The whole downlink and downlink automatic test subsystem is designed and implemented. In addition, this paper describes in detail how to start the fading model subsystem, how to obtain UE log from uplink and downlink, and how to convert UE log from uplink and downlink to csv files. And the realization method of the key technology, such as establishing the proprietary load in the whole fading test. Combining with the actual test task, this paper designs the test cases of function test, key function test and system integration test, and optimizes and adjusts the code for the problems in the system integration test. From the test results, the function and performance of the system can meet the original design indicators and requirements. At present, the system has been applied to the TD-LTE base station fading test of Shanghai Bell Company. The system results show that compared with the traditional test engineers, the degree of automation is over 90%, the correct rate of stress testing is over 99%, the efficiency of test is improved nearly 7 times, and the test speed is accelerated. Liberates the test engineer's energy and time, also provides more time convenience for the project manager.
【学位授予单位】：上海交通大学
【学位级别】：硕士
【学位授予年份】：2014
【分类号】：TN929.5

【共引文献】