微纳粒子光学散射分析

发布时间：2018-05-03 21:37

  本文选题：散射 + 尺寸可比　； 参考：《物理学报》2017年09期

【摘要】：为实现利用光学方式对微纳尺度粒子性质的研究,探讨了亚微米线及亚微米球对光电磁波的散射效应.微纳米尺度粒子的光学散射,散射粒子尺寸与入射光波长尺寸可满足米氏(Mie)散射条件.利用Matlab数值模拟的方式,将分析结果以模拟图的形式清晰地展现出来.满足尺寸条件的层状粒子以及任意多个散射粒子存在时对电磁波的散射都可采用Mie散射分析方法,并且针对多粒子散射,分析了散射体位于不同位置时对散射造成的影响.通过分析光学散射光场相关的微分散射截面及近场散射电磁场分布,可得出散射光场随散射角度的变化趋势,以及散射光场受各类因素的影响,包括入射光偏振态、散射粒子尺寸、散射粒子结构及粒子构成层数、散射粒子数量等的影响,也包括一些隐含因素对散射光场的影响,如散射粒子与周围介质的相对折射率.本文的科学意义体现在:与入射光波长尺寸可比的亚微米尺度的粒子,可用作传感器,对于其位移的探测可通过光学方式来实现,而由于粒子本身特性对散射光的影响具有一定的参考价值,从而使通过光学方式对机械位移的读出具有更高准确度.研究结果对于光学方式探测亚微米线机械振动具有指导意义.
[Abstract]:In order to study the properties of micro- and nanoscale particles in optical mode, the scattering effects of submicron lines and submicron spheres on optical electromagnetic waves are discussed. The size of scattering particles and the length of incident light can satisfy the scattering condition of MieS. By using Matlab numerical simulation, the analysis results are clearly presented in the form of simulation diagram. The scattering of electromagnetic waves by layered particles and any number of scattering particles in the presence of the size condition can be analyzed by Mie scattering method. The effect of scattering body position on scattering is analyzed for multi-particle scattering. By analyzing the differential scattering cross section of optical scattering light field and the distribution of near-field scattering electromagnetic field, the variation trend of scattering light field with scattering angle is obtained, and the scattering light field is affected by various factors, including the polarization state of incident light. The effects of the size of scattering particles, the structure of scattered particles, the number of layers of scattered particles and the number of scattered particles on the scattering light field, such as the relative refractive index of scattering particles and surrounding media, are also included in the influence of the size of scattered particles, the number of scattered particles and the number of scattered particles. The scientific significance of this paper lies in the fact that submicron particles, comparable to the length of incident light, can be used as sensors, and their displacement can be detected by optical means. Due to the influence of particle properties on scattering light, the readout of mechanical displacement through optical mode has higher accuracy. The results are useful for the optical detection of submicron line mechanical vibration.
【作者单位】： 中国科学院强磁场科学中心;中国科学技术大学;
【基金】：中国科学院强磁场科学中心薛飞研究员提供的科研环境与资金支持
【分类号】：O436.2
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本文编号：1840215