纳秒激光驱动的数千电子伏特X射线背光面源特性

发布时间：2018-05-18 11:30

本文选题：X射线光学 + 背光面源　；参考：《中国激光》2017年09期

【摘要】：数千电子伏特(Multi-keV)量级的X射线背光成像是高能密度等离子体物理实验中常用的一种诊断技术。在神光II激光装置上,研究了纳秒激光驱动钛4.7keV波段及氯2.7keV波段背光面源的性能。研究结果表明,氯背光能谱以类He线及类H线为主,其中2.7keV波段的类He-α线最强;在当前神光II激光加载能力下,氯背光面源相对强度超过钛背光面源一个量级,因此,可选用氯He-α线的X光探针进行背光诊断。
[Abstract]:The X ray backlight imaging of thousands of electron volt (Multi-keV) magnitude is a diagnostic technique commonly used in high energy density plasma physics experiments. The performance of nanosecond laser driven Ti 4.7keV and 2.7keV band backlight sources was studied on the Shen Guang II laser device. The results show that the energy spectrum of the chlorine back light spectrum is dominated by the class of He line and the H like line. The 2.7keV band like He- alpha line is the strongest, and the relative intensity of the chlorinated backlight surface is more than one magnitude of the titanium back light surface source under the current optical II laser loading capacity. Therefore, the X light probe of the chlorine He- alpha line can be selected for the backlight diagnosis.
【作者单位】：中国工程物理研究院上海激光等离子体研究所;
【基金】：国家自然科学基金(61475146)
【分类号】：O434.1;TL632

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