关于液晶联动的分析研究

发布时间：2018-05-01 13:25

本文选题：LC + Margin　；参考：《液晶与显示》2017年07期

【摘要】：目前京东方部分产品量产时易出现重力Mura、低温气泡等问题,本文针对问题产生的原因进行分析,并对PS高度测试方法、PS高度与液晶量的联动方法进行分析研究及实验验证。目前测试PS高度的方法并未考虑工艺波动造成的色阻段差的变化对盒内体积的影响,本文首先提出了可以反映量产时色阻变化的PS高度测量方法,另根据LC Margin评价结果及PS形变量结果给出了PS高度与液晶量的联动关系。通过对PS高度与液晶量联动的分析研究,有效解决了因量产工艺波动造成的PS偏差引起的实际量产时滴下的液晶量并非对应的LC Margin中心的问题,从而避免出现重力Mura和低温气泡等LC Margin相关的问题,并且扩大了3%的工程管控范围,为企业的产品品质和竞争力的提升奠定了良好的基础。
[Abstract]:At present, some problems such as gravity Mura, low temperature bubble and so on are easy to appear in the mass production of some products in Beijing and East. The causes of the problems are analyzed, and the linkage method of PS height measurement method and liquid crystal quantity is analyzed and verified by experiments. At present, the method of measuring PS height does not take into account the influence of the variation of color resistance section difference caused by process fluctuation on the volume of the box. In this paper, a new method of measuring PS height is proposed, which can reflect the change of color resistance in mass production. On the basis of LC Margin evaluation results and PS shape variables, the relationship between PS height and liquid crystal quantity is given. By analyzing the linkage between PS height and liquid crystal quantity, the problem that the liquid crystal drop is not the corresponding LC Margin center caused by PS deviation caused by the fluctuation of mass production process is effectively solved. Therefore, the problems related to LC Margin such as gravity Mura and cryogenic bubbles are avoided, and the scope of engineering control is enlarged by 3%, which lays a good foundation for the improvement of product quality and competitiveness of enterprises.
【作者单位】：合肥鑫晟光电科技有限公司;
【分类号】：TN873.93

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