红外透射式塑料薄膜测厚仪研究
发布时间：2018-07-13 14:59
【摘要】：现在塑料薄膜在日常生活和工业生产上得到越来越多的广泛应用,市场对塑料薄膜产品的需求日益增大,薄膜厚度控制也愈加严格。可是,现在采用的传统人工机械式测量效率太低,因为人工测量,是断续式,不能实时得到薄膜的厚度,薄膜质量控制存在滞后。为了满足薄膜品质控制的要求,高效、高精度、实时性的薄膜厚度测量是必要的。有鉴于此本课题开展了采用红外光线进行塑料薄膜测厚在线测量仪的研究工作。本课题首先采用红外线测量塑料薄膜的应用背景,对红外线、塑料薄膜生产过程进行了研究,红外线测量塑料薄膜度的原理,塑料薄膜测厚仪的系统整体设计。本文详细论述了塑料薄膜测厚仪的硬件系统部分的设计,包括红外驱动电路的设计、信号处理电路的设计。红外驱动电路从信号发送,信号放大到恒流输出,各个元件选择都进行了介绍。信号处理电路从信号的流向,依次介绍了光敏元件选择、光敏电路设计,模拟滤波器元件选择和电路设计,信号放大和增强电路的设计思路和设计原理,A/D采样电A/D芯片的选型及应用电路的设计,TMS320F2812主控芯片核心电路设计。详细介绍了薄膜测量系统的控制器的程序设计,从红外驱动电路的程序算法,到DSP信号处理电路的初始化、主程序、数据处理程序、触摸屏程序。最后对总结并分析了系统实验数据,系统测量误差及其来源进行了解析。本文设计并调试完成了一个采用激光基于DSP的嵌入式塑料薄膜厚度测量仪样机,它集成了薄膜厚度实时在线测量、友好的人机交互界面、良好的稳定性等功能。实际多次测试实验证明,该系统可以实现非接触测量,减小人为测量误差,提高测量精度,实时显示测量数值,提高薄膜测量的效率和质量。
[Abstract]:Nowadays, plastic film is more and more widely used in daily life and industrial production. The market demand for plastic film products is increasing day by day, and the film thickness control is becoming more and more strict. However, the efficiency of traditional manual mechanical measurement is too low, because manual measurement is intermittent, the thickness of film can not be obtained in real time, and the film quality control is lagging behind. In order to meet the requirements of film quality control, it is necessary to measure the film thickness with high efficiency, high precision and real time. In view of this, the research work of measuring the thickness of plastic film by infrared ray is carried out. In this paper, the application background of infrared measurement of plastic film is adopted, the production process of infrared and plastic film is studied, the principle of infrared measurement of plastic film degree and the whole system design of plastic film thickness gauge are designed. In this paper, the design of the hardware system of the plastic film thickness gauge is discussed in detail, including the design of the infrared driving circuit and the design of the signal processing circuit. Infrared drive circuit from signal transmission, signal amplification to constant current output, each component selection are introduced. Signal processing circuit from the direction of the signal, in turn introduced the Guang Min element selection, Guang Min circuit design, analog filter element selection and circuit design, Design idea and Design principle of signal Amplifier and Enhancement Circuit the selection and application circuit design of A / D sampling electrical AP-D chip and the design of the core circuit of TMS320F2812 main control chip. The program design of the controller of thin film measurement system is introduced in detail, from the program algorithm of infrared drive circuit to the initialization of DSP signal processing circuit, main program, data processing program and touch screen program. Finally, the system experimental data, system measurement error and its source are analyzed. In this paper, we design and debug a prototype of the embedded plastic film thickness measuring instrument based on DSP, which integrates the functions of real-time and on-line measurement of film thickness, friendly man-machine interface, good stability and so on. The experimental results show that the system can realize non-contact measurement, reduce the error of artificial measurement, improve the accuracy of measurement, display the measurement value in real time, and improve the efficiency and quality of thin film measurement.
【学位授予单位】：哈尔滨工业大学
【学位级别】：硕士
【学位授予年份】：2016
【分类号】：TH741
本文编号：2119792
[Abstract]:Nowadays, plastic film is more and more widely used in daily life and industrial production. The market demand for plastic film products is increasing day by day, and the film thickness control is becoming more and more strict. However, the efficiency of traditional manual mechanical measurement is too low, because manual measurement is intermittent, the thickness of film can not be obtained in real time, and the film quality control is lagging behind. In order to meet the requirements of film quality control, it is necessary to measure the film thickness with high efficiency, high precision and real time. In view of this, the research work of measuring the thickness of plastic film by infrared ray is carried out. In this paper, the application background of infrared measurement of plastic film is adopted, the production process of infrared and plastic film is studied, the principle of infrared measurement of plastic film degree and the whole system design of plastic film thickness gauge are designed. In this paper, the design of the hardware system of the plastic film thickness gauge is discussed in detail, including the design of the infrared driving circuit and the design of the signal processing circuit. Infrared drive circuit from signal transmission, signal amplification to constant current output, each component selection are introduced. Signal processing circuit from the direction of the signal, in turn introduced the Guang Min element selection, Guang Min circuit design, analog filter element selection and circuit design, Design idea and Design principle of signal Amplifier and Enhancement Circuit the selection and application circuit design of A / D sampling electrical AP-D chip and the design of the core circuit of TMS320F2812 main control chip. The program design of the controller of thin film measurement system is introduced in detail, from the program algorithm of infrared drive circuit to the initialization of DSP signal processing circuit, main program, data processing program and touch screen program. Finally, the system experimental data, system measurement error and its source are analyzed. In this paper, we design and debug a prototype of the embedded plastic film thickness measuring instrument based on DSP, which integrates the functions of real-time and on-line measurement of film thickness, friendly man-machine interface, good stability and so on. The experimental results show that the system can realize non-contact measurement, reduce the error of artificial measurement, improve the accuracy of measurement, display the measurement value in real time, and improve the efficiency and quality of thin film measurement.
【学位授予单位】：哈尔滨工业大学
【学位级别】：硕士
【学位授予年份】：2016
【分类号】：TH741
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本文编号：2119792
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