GMR传感器在无损检测中的研究与应用
[Abstract]:Nondestructive testing (NDT) is one of the most important methods to detect the defect of zero devices in the key parts of aircraft, ships, automobiles and other construction industries, and the technology of nondestructive testing is used to detect the defects of zero devices in the key parts. Eliminating potential hidden dangers and ensuring the safe operation of equipment play an extremely important role. Among them, how to improve the detection accuracy is a big problem that needs to be solved. In this paper, a new nondestructive detection system is designed based on the principle of nondestructive eddy current testing and the introduction of a high sensitivity Giant Magnetoresistance (GMR) (GMR) chip. In this paper, the structure of the eddy current probe is studied. The sensitivity of the traditional coil probe decreases with the decrease of the working frequency. A single exciting coil is used in the existing eddy current probe based on the sensor chip. The magnetic field excited by the AC current will interfere with the eddy current signal and affect the defect detection. In view of this, the structure of the probe is improved, that is, an additional elimination coil is added on the basis of the exciting coil to reduce the disturbance of the excitation field to the eddy current signal, thus improving the detection accuracy. In this paper, a nondestructive testing model is simulated by using the finite element software ANSOFT MAXWELL, in which an elimination coil is added to the structure of the eddy current detection probe. The simulation results show that compared with the conventional probe with only a single excitation coil, The new GMR probe uses double coils, and the magnetic field in the central chip of the coil is much larger and the magnetic field around it is weaker. Subsequently, the GMR (GMR) eddy current probe with high signal-to-noise ratio was fabricated. Secondly, this paper also designs and improves a nondestructive testing system for the new probe. The system design is mainly divided into two parts: hardware circuit and software, in which the hardware circuit design mainly includes sine wave generation circuit. Power amplifier circuit and signal conditioning circuit. The sinusoidal wave generating circuit uses the single chip computer to control the DDS chip to produce the sine wave of a certain frequency, and the signal conditioning circuit uses the phase-locked amplification, amplification and low-pass filter to adjust the original output signal of the probe. The software is focused on the sine wave generation and subsequent data processing on the single chip microcomputer programming control chip. The data acquisition card and LABVIEW program are used to realize the real-time processing and observation of the data information. Through the later debugging of PCB board, each module in the system can play its own good function. Finally, the defect detection of the NDT system designed above is carried out, and the conclusion is drawn through the comparison of many groups of experimental data: the new structure GMR probe can detect the defects in the specimen and the detection accuracy is high.
【学位授予单位】:电子科技大学
【学位级别】:硕士
【学位授予年份】:2017
【分类号】:TP212;TP274
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