基于SBST的LVDT解调电路在线测试研究

发布时间：2018-11-12 15:34

【摘要】：LVDT(Linear Variable Differential Transformer)解调电路芯片是航空发动机系统主控器的重要功能模块之一,系统复杂度的提升和芯片制造加工深亚微米工艺的不断改进,使得该芯片越来越容易受到各种故障的影响。为了提高航空发动机控制系统的整体可靠性,迫切需要配备有效的故障在线检测模块,同时在芯片的设计阶段就需要考虑测试方法的有效施加。因此,本文研究了基于软件自测试SBST(Software-Based-Self-Test)的LVDT解调电路在线测试方法。在分析了现有集成电路芯片在线测试方法的基础上,本文提出了一种基于软件自测试的测试结构,所添加的微处理器用于施加测试向量、控制测试流程、采集测试响应以及在线测试诊断,测试调度程序存于处理器的ROM,而相关的测试激励和理想响应数据存于RAM中。基于微处理器的指令,所编写的测试控制及测试调度程序可实现对LVDT解调电路的各个功能模块的在线测试。为了实现规模小、故障覆盖率高的测试数据,除存储器模块采用了改进的March C+算法,其他被测功能模块的测试数据生成均采用了ATPG工具软件TetraMAX。该基于SBST的测试结构具有良好的扩展性和灵活性,可适应被测LVDT芯片的功能设计和性能参数的调整。此外,针对在线测试结构的核心单元处理器模块,本文提出了一种基于SBST的微处理器自测试方法。根据每个子模块的功能针对性进行测试生成,底层故障模型能够通过相应的处理器指令程序得到测试。基于该在线测试方法,构建了基于SBST的LVDT解调器原型电路,并采用滤波器、控制器等模块为被测电路,仿真了SBST的动态测试流程,通过Design Complier等EDA软件和基于Spartan6 FPGA的自开发硬件仿真平台验证了在线测试电路功能,并给出了性能分析。
[Abstract]:The LVDT (Linear Variable Differential Transformer) demodulation circuit chip is one of the important function modules of the main controller of the aero-engine system. This makes the chip more and more vulnerable to various failures. In order to improve the overall reliability of the aero-engine control system, it is urgent to equip an effective on-line fault detection module and to consider the effective application of the test method in the design phase of the chip. Therefore, the online testing method of LVDT demodulation circuit based on software self-test SBST (Software-Based-Self-Test) is studied in this paper. Based on the analysis of the existing on-line testing methods for IC chips, a testing structure based on software self-testing is proposed in this paper. The added microprocessor is used to apply the test vector and control the test flow. The test scheduler is stored in the ROM, of the processor while the test excitation and ideal response data are stored in the RAM. Based on the instruction of microprocessor, the test control and test scheduling program can realize the on-line test of each function module of LVDT demodulation circuit. In order to realize the test data with small scale and high fault coverage, except for the memory module which adopts the improved March C algorithm, the test data of the other function modules are generated by the ATPG tool software TetraMAX.. The test structure based on SBST has good expansibility and flexibility, and it can adapt to the function design and performance parameter adjustment of LVDT chip under test. In addition, a microprocessor self-testing method based on SBST is proposed for the core unit processor module of on-line testing architecture. According to the function of each sub-module, the underlying fault model can be tested by the corresponding processor instruction program. Based on the on-line testing method, the prototype circuit of LVDT demodulator based on SBST is constructed, and the dynamic test flow of SBST is simulated by using filter, controller and other modules as the circuit to be tested. The function of on-line test circuit is verified by EDA software such as Design Complier and self-developed hardware simulation platform based on Spartan6 FPGA, and the performance analysis is given.
【学位授予单位】：南京航空航天大学
【学位级别】：硕士
【学位授予年份】：2017
【分类号】：V233.7

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