CMOS图像传感器温度噪声及去噪研究
发布时间:2018-12-07 09:32
【摘要】:近年来,各种卫星平台和空间飞行系统都需要像感器来进行信息数据的传输。随着航天技术的普遍性,像感器在卫星光通信系统中的作用愈发重要。由于半导体工艺逐渐成熟,CMOS像感器由于其集成度高、抗干扰能力强、能耗低、价格低、体积小等优点,获得越来越高的关注。在航天领域中,人们对星载设备的质量、尺寸、能耗等具有非常严格的要求,而CMOS像感器的诸多特性更加符合这一条件。而对于在空间环境工作的成像器件而言,复杂的空间外热流环境以及卫星平台其他热载荷的作用也是影响其性能的一个重要因素。光电器件的空间应用可靠性直接关系卫星与载荷的在轨性能与运行寿命,目前很多科研小组将注意力放在CMOS像感器的核心器件光电二极管以及MOSFET等半导体器件的温度效应上,而对于CMOS像感器整体的温度效应研究并不多见。本论文针对以上问题,主要完成以下几方面的研究:总结了CMOS像感器温度噪声的研究意义和研究现状,提出了研究CMOS像感器温度噪声必要性。结合光电二极管、MOSFET以及CMOS像感器的工作机理,阐述了温度对CMOS像感器及其核心器件光电二极管和MOSFET的工作影响。以暗输出灰度值变化规律为基础建立均值去噪模型,以噪声灰度分布为基础建立灰度去噪模型。本文开创性的研究环境温度对CMOS图像传感系统而非某一半导体元件的影响,并围绕该课题进行了多次实验研究,取得了规律性的成果为以后在空间环境中工作的CMOS像感器的温度效应提出理论指导和实验根据,进而加强使用CMOS像感器的卫星光通信终端的跟瞄精准程度,为提出相应的影响补偿措施提供指导,同时对利用温度噪声预估器件寿命也具有一定的参考价值。
[Abstract]:In recent years, all kinds of satellite platforms and space flight systems need image sensors to transmit information data. With the universality of space technology, image sensor plays an increasingly important role in satellite optical communication system. Due to the maturation of semiconductor technology, CMOS image sensor has gained more and more attention because of its advantages of high integration, strong anti-interference ability, low energy consumption, low price and small volume. In the field of spaceflight, people have strict requirements on the quality, size and energy consumption of spaceborne equipment, and many characteristics of CMOS image sensor are more suitable for this condition. For imaging devices operating in space environment, the complex outer heat flux environment and other thermal loads of satellite platform are also an important factor affecting its performance. The reliability of optoelectronic devices in space is directly related to the on-orbit performance and service life of satellites and payloads. At present, many scientific teams have focused their attention on the temperature effects of photodiodes, the core devices of CMOS image sensors, and semiconductor devices such as MOSFET. But the temperature effect of CMOS image sensor is rare. In order to solve the above problems, this paper mainly studies the following aspects: the research significance and research status of CMOS image sensor temperature noise are summarized, and the necessity of studying CMOS image sensor temperature noise is put forward. Combined with the working mechanism of photodiode, MOSFET and CMOS image sensor, the influence of temperature on the work of CMOS image sensor and its core device, photodiode and MOSFET is expounded. The mean denoising model is established on the basis of the variation rule of dark output gray value, and the gray scale denoising model is established based on the distribution of noise gray scale. In this paper, the effect of ambient temperature on CMOS image sensing system, not a semiconductor component, has been studied, and many experiments have been carried out around the subject. The regular results provide theoretical guidance and experimental basis for the temperature effect of the CMOS image sensors working in the space environment in the future, and further enhance the accuracy of tracking and pointing of the satellite optical communication terminals using the CMOS image sensors. It provides guidance for the corresponding influence compensation measures, and also has certain reference value for predicting the device life by using temperature noise.
【学位授予单位】:哈尔滨工业大学
【学位级别】:硕士
【学位授予年份】:2017
【分类号】:TP212
本文编号:2366988
[Abstract]:In recent years, all kinds of satellite platforms and space flight systems need image sensors to transmit information data. With the universality of space technology, image sensor plays an increasingly important role in satellite optical communication system. Due to the maturation of semiconductor technology, CMOS image sensor has gained more and more attention because of its advantages of high integration, strong anti-interference ability, low energy consumption, low price and small volume. In the field of spaceflight, people have strict requirements on the quality, size and energy consumption of spaceborne equipment, and many characteristics of CMOS image sensor are more suitable for this condition. For imaging devices operating in space environment, the complex outer heat flux environment and other thermal loads of satellite platform are also an important factor affecting its performance. The reliability of optoelectronic devices in space is directly related to the on-orbit performance and service life of satellites and payloads. At present, many scientific teams have focused their attention on the temperature effects of photodiodes, the core devices of CMOS image sensors, and semiconductor devices such as MOSFET. But the temperature effect of CMOS image sensor is rare. In order to solve the above problems, this paper mainly studies the following aspects: the research significance and research status of CMOS image sensor temperature noise are summarized, and the necessity of studying CMOS image sensor temperature noise is put forward. Combined with the working mechanism of photodiode, MOSFET and CMOS image sensor, the influence of temperature on the work of CMOS image sensor and its core device, photodiode and MOSFET is expounded. The mean denoising model is established on the basis of the variation rule of dark output gray value, and the gray scale denoising model is established based on the distribution of noise gray scale. In this paper, the effect of ambient temperature on CMOS image sensing system, not a semiconductor component, has been studied, and many experiments have been carried out around the subject. The regular results provide theoretical guidance and experimental basis for the temperature effect of the CMOS image sensors working in the space environment in the future, and further enhance the accuracy of tracking and pointing of the satellite optical communication terminals using the CMOS image sensors. It provides guidance for the corresponding influence compensation measures, and also has certain reference value for predicting the device life by using temperature noise.
【学位授予单位】:哈尔滨工业大学
【学位级别】:硕士
【学位授予年份】:2017
【分类号】:TP212
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