像差校正高分辨透射电子显微术及其在表征功能氧化物材料结构及界面中的应用
发布时间：2018-08-08 13:38
【摘要】：简要介绍基于像差校正高分辨透射电子显微镜的负球差成像技术及其在研究功能氧化物材料原子构型中的应用。在亚埃尺度的空间分辨率下,负球差成像技术不但可以获得高衬度的原子尺度结构像,而且可以在皮米精度测量材料中的原子的相对位移,从而精确表征材料结构、晶格缺陷的细微变化及其对材料性能的影响。负球差成像技术为定量解析材料中包含轻原子(例如,氧)在内的精细结构问题提供了有力的手段。重点介绍了负球差成像技术在表征铁电材料电偶极矩、畴结构及畴壁,氧化物异质界面和三维Mg O晶体表面精细结构中的应用。
[Abstract]:The negative spherical aberration imaging technique based on aberration correction high resolution transmission electron microscope and its application in the study of atomic configuration of functional oxide materials are briefly introduced. At the spatial resolution of Yae scale, the negative spherical aberration imaging technique can not only obtain the high contrast atomic scale structure image, but also measure the relative displacement of atoms in the material accurately, so that the material structure can be accurately characterized. The minor changes of lattice defects and their effects on the properties of materials. Negative spherical aberration imaging provides a powerful means for the quantitative analysis of fine structure problems involving light atoms (e.g. oxygen) in materials. The application of negative spherical aberration imaging in the characterization of ferroelectric dipole moment, domain structure and domain wall, oxide heterogeneity interface and surface fine structure of 3D MgO crystal is introduced.
【作者单位】： 西安交通大学材料科学与工程学院金属材料强度国家重点实验;西安交通大学微电子学院;德国于利希研究中心ER-C电镜中心;
【基金】：国家自然科学基金资助项目(51471169,51390472) 科技部973计划项目(2015CB654903)
【分类号】：TB34
[Abstract]:The negative spherical aberration imaging technique based on aberration correction high resolution transmission electron microscope and its application in the study of atomic configuration of functional oxide materials are briefly introduced. At the spatial resolution of Yae scale, the negative spherical aberration imaging technique can not only obtain the high contrast atomic scale structure image, but also measure the relative displacement of atoms in the material accurately, so that the material structure can be accurately characterized. The minor changes of lattice defects and their effects on the properties of materials. Negative spherical aberration imaging provides a powerful means for the quantitative analysis of fine structure problems involving light atoms (e.g. oxygen) in materials. The application of negative spherical aberration imaging in the characterization of ferroelectric dipole moment, domain structure and domain wall, oxide heterogeneity interface and surface fine structure of 3D MgO crystal is introduced.
【作者单位】： 西安交通大学材料科学与工程学院金属材料强度国家重点实验;西安交通大学微电子学院;德国于利希研究中心ER-C电镜中心;
【基金】：国家自然科学基金资助项目(51471169,51390472) 科技部973计划项目(2015CB654903)
【分类号】：TB34
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