交直流老化后ZnO压敏电阻宏观电容量随时间变化的特性分析

发布时间：2018-03-05 18:27

本文选题：氧化锌压敏电阻　切入点：肖特基势垒　出处：《中国电力》2016年11期 　论文类型：期刊论文

【摘要】：针对ZnO压敏电阻在交、直流老化作用后,其宏观电容量随时间变化特性的问题,基于砖块模型(block model)对影响ZnO压敏电阻宏观电容量的相关参数进行了理论分析,通过对ZnO压敏电阻样品分别施加不同时长的交流以及直流老化试验时,发现ZnO压敏电阻的宏观电容量在接受交、直流老化后随着时间的延长呈现先降低后增长的趋势;当交、直流老化时间较短时,宏观电容量相较初始值存在小幅降低,而当交、直流老化时间较长时,宏观电容量相较初始值存在大幅的增长,得出宏观电容量随时间的变化是由界面态俘获电子的释放过程以及晶界层热破坏过程共同作用所导致的结论,这对研究ZnO压敏电阻的老化特性具有一定的参考价值。
[Abstract]:In order to solve the problem that the macroscopic capacitance of ZnO varistor changes with time after AC and DC aging, the related parameters affecting the macroscopic capacitance of ZnO varistor are analyzed theoretically based on brick model. By applying different length AC and DC aging test to ZnO varistor samples, it is found that the macroscopic capacitance of ZnO varistor is accepting AC, and after DC aging, it decreases first and then increases with time. When the direct current aging time is short, the macroscopic capacitance decreases slightly compared with the initial value, while when AC, DC aging time is longer, the macroscopic capacitance increases greatly compared with the initial value. It is concluded that the change of macroscopic capacitance with time is caused by the interaction of interfacial state capture electron release process and grain boundary thermal destruction process, which has some reference value for studying the aging characteristics of ZnO varistor.
【作者单位】：扬州市气象局;
【基金】：国家自然科学基金资助项目(41175003) 江苏高校优势学科建设工程资助项目~~
【分类号】：TM54

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