电连接器恒定应力加速退化建模与验证

发布时间：2018-03-18 08:32

本文选题：电连接器　切入点：贮存可靠性　出处：《浙江理工大学》2017年硕士论文　论文类型：学位论文

【摘要】：电连接器作为各型号装备中的基础机电元件,可实现型号与地面设备以及级间电路的快速连接和分离,在型号的电气和控制系统中数量众多,是传递电能和信号必不可少的接口元件,其可靠性对型号系统寿命影响很大,因此,准确评估电连接器的贮存寿命,对型号定寿延寿工作意义重大。电连接器随型号在贮存期会经历库存、测试、运输、训练和战备值班等状态,在各个状态分别会经受温度、湿度、振动、电流、插拔等因素的影响,在计入整个贮存剖面各因素影响的电连接器贮存寿命加速试验中,需要精确控制插拔、电流等各种应力施加的时间间隔和时长比例,其前提是获得电连接器在库存环境中(单纯考虑温度)的退化模型。现有的混合效应模型已不能满足计入整个贮存剖面应力的加速试验对退化轨迹的精度要求,同时,从电连接器接触对表面的微观形貌和接触对电化学腐蚀的微观机理来看,某些马尔科夫(Markov)过程才是更接近真实的描述,因此有必要对精确描述电连接器在温度应力下性能退化过程的模型进行研究。本文以在型号上广泛使用的Y11P-1419型电连接器为对象,通过对其失效模式和失效机理分析,确定了电连接器接触对表面氧化膜生长和扩散的微观机理。基于该微观机理,建立了基于布朗运动的电连接器接触性能退化模型,以及模型中退化率、扩散系数与温度应力之间的关系,即加速退化方程。最后基于White法和Breusch-Pagan法对从机理层面所建的接触性能退化模型和加速退化方程进行了检验,验证了所建模型的正确性,为后续电连接器贮存寿命评估的加速试验中各应力施加的时间点和时长的精确控制提供了理论依据。本文一共分5章,具体章节安排如下:第1章,本章阐述了课题研究的背景、目的及意义,从性能退化模型、试验数据统计分析和模型的检验方法三个方面入手,分析了国内外相关领域的研究现状及存在的问题,提出了论文的主要研究内容和相关思路。第2章,本章主要分析了电连接器在库存状态下的失效模式和失效机理,确定了导致电连接器接触失效的主要原因是接触对表面氧化膜层的生长;从接触对表面孔隙、接触斑点的大小、分布等膜层生长和扩散的随机性,揭示了接触电阻值呈波动性增长的根本原因。第3章,结合电连接器贮存状态下的失效模式和失效机理分析,基于电连接器接触性能退化量呈波动性增长的微观机理,利用布朗运动描述了电连接器接触性能退化的随机过程,建立了基于维纳过程的电连接器接触性能退化模型;基于中心极限定理和化学反应论,研究了漂移系数和扩散系数与温度应力之间的关系,建立了相应的加速退化方程。第4章,本章给出了电连接器在温度应力作用下的加速退化试验方案,包括各应力水平下的样本量、测试时间间隔、截尾时间等。收集各应力水平下电连接器的接触性能退化数据,利用K-W法进行了各电连接器的同分布检验,并利用最小二乘法和二步极大似然估计法对试验数据进行统计分析,给出了性能退化模型和加速退化方程的参数估计值。第5章,本章提出了电连接器接触性能退化模型和加速退化方程的验证方法。利用4组恒定温度应力下加速退化试验数据,结合图分析法、White检验法和Breusch-Pagan检验法验证了电连接器的性能退化模型;从试验数据的统计检验出发,利用线性回归分析法验证了电连接器的加速退化方程;检验结果表明,该模型能很好的描述电连接器接触性能退化的随机过程和性能退化随温度的变化规律,证明了从失效机理层面建立的模型的正确性。第6章,对论文的研究工作进行总结,并且对仍需进一步研究的内容提出建议。
[Abstract]:Electrical connector as the basis of various types of electromechanical components in equipment, can realize the model and ground equipment and interstage circuit fast connection and separation, the types of electrical and control system in a large number, is essential to transfer the power interface element and signal, the great influence on the type of system reliability, accurate evaluation of storage life therefore the life of the electric connector, the type of life extension work is of great significance. With the electric connector model in the storage period will experience inventory, testing, transportation, training and readiness of each state in the state, respectively, will be subject to temperature, humidity, vibration, impact current, plug and other factors, in consideration of the whole storage section the factors of electrical connector accelerated life test, requires precise control of plug, current various applied stress time interval and length ratio, the premise is to obtain the electrical connector in inventory The environment (only considering temperature) degradation model. The mixed model has been unable to meet in the whole storage sectional stress accelerated test requirements on the accuracy of the degradation path at the same time, from the electrical connector on the surface morphology and contact the microscopic mechanism of electrochemical corrosion, some process is Markoff (Markov) more realistic description, so it is necessary to accurately describe the electric connector on temperature stress in the degradation process performance model. Based on the Y11P-1419 type electrical connector is widely used in the model as the object, based on the failure mode and failure mechanism analysis, determine the electrical connector on the micro mechanism of surface oxide growth and the microscopic mechanism of diffusion. Based on establishing the degradation model of connector based on motion performance of Brown, and the model of degradation rate, diffusion coefficient and The temperature stress, the accelerated degradation equation. Finally, based on the White method and Breusch-Pagan method on contact performance built from the mechanism level degradation model and accelerated degradation equation was tested to verify the correctness of the model, for the subsequent storage life assessment of electrical connector accelerated stress testing in the precise control applied time point and time to provide a theoretical basis. This paper is divided into 5 chapters, the chapters are arranged as follows: the first chapter, this chapter describes the research background, purpose and significance, the performance degradation model from three aspects, test analysis and model test data statistics with the analysis of current research status related fields at home and abroad and the existing problems, puts forward the main research contents and ideas. In the second chapter, this chapter mainly analyzes the electric connector in the inventory under the condition of failure mode and failure mechanism, determine The electrical connector failure is the main reason for the growth of oxide film contact surface; from the contact on the surface pore, the contact spot size, random distribution of film growth and diffusion, reveals the contact resistance is fundamental reason for the fluctuation of growth. In the third chapter, combined with the analysis of the failure modes and failure state the mechanism of electric connector storage, electrical connector performance degradation mechanism is the volatility of growth based on stochastic process describes the electric connector contact degradation performance using the Brown movement, establishing the degradation model of connector performance based on Wiener process; the central limit theorem and chemical reaction theory based on the drift coefficient and diffusion coefficient and the temperature of the relationship between stresses, established corresponding accelerated degradation equation. In the fourth chapter, this chapter gives the electrical connector under the action of temperature stress and degradation speed The test program, including the amount of samples should be under the stress of the test interval, etc. should be censored time collection of the contact performance degradation data under the stress of electrical connectors, the same distribution test each electric connector by using the K-W method, and using the least squares method and two step maximum likelihood statistical analysis of test data method, gives the performance degradation model and accelerated degradation equation parameter estimates. In the fifth chapter, this chapter puts forward the method to verify the electrical connector performance degradation model and accelerated degradation equation. The stress accelerated degradation test data using 4 groups of constant temperature, combining with graph analysis method, White test method and Breusch-Pagan verification the performance degradation model of the electric connector; starting from the statistical analysis of test data, the regression analysis method of electrical connectors verified by linear accelerated degradation equation; test results show that the model Can well describe the stochastic process and the performance degradation of electrical connector contact performance degradation with temperature variation, prove the correctness of the failure mechanism from the level model. In the sixth chapter, the research work of the dissertation is summarized, and further research is needed on the content of proposals.

【学位授予单位】：浙江理工大学
【学位级别】：硕士
【学位授予年份】：2017
【分类号】：TM503.5

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