基于空间电荷效应的绝缘老化寿命模型的研究进展

发布时间：2018-05-23 10:30

本文选题：绝缘材料 + 直流　；参考：《高电压技术》2016年03期

【摘要】：电力设备用绝缘材料在使用过程中承受电、热、机械等多种因素的应力作用,电气性能逐渐下降,研究绝缘材料的老化机理和寿命模型对材料寿命评估具有重要的意义。首先从传统的绝缘材料宏观老化模型出发,总结了电、热、机械应力作用以及联合作用下的绝缘材料老化寿命模型,其次从微观角度总结归类了由于空间电荷效应导致绝缘材料微观缺陷的几种绝缘老化寿命模型。最后探讨了未来绝缘材料老化寿命模型的研究方向和发展趋势。通过对比分析了不同宏观老化模型的优缺点,并从微观角度分析了空间电荷效应及其引发的其他效应(材料内部微孔的形成、局部放电的发生、电树枝的引发与生长等)对绝缘材料的老化破坏作用。基于空间电荷效应的绝缘老化寿命模型有望用于评估直流下的绝缘老化寿命,今后对于绝缘材料寿命模型的研究应该由宏观转向微观,并且应借助各种先进的宏观微观观测分析手段,将仿真和实验紧密结合,采用动态分析方法建立物理意义明确、失效时间准确的绝缘老化寿命模型。
[Abstract]:The electrical properties of insulation materials for power equipment are gradually declining due to the stress of electric, thermal, mechanical and other factors. It is of great significance to study the aging mechanism and life model of insulating materials. Firstly, based on the traditional macroscopic aging model of insulating material, the aging life model of insulation material under electric, thermal, mechanical stress and combined action is summarized. Secondly, several aging life models of insulation materials due to space charge effect are summarized and classified from the microcosmic point of view. Finally, the research direction and development trend of aging life model of insulating materials in the future are discussed. The advantages and disadvantages of different macroscopical aging models are compared, and the space charge effect and its other effects (the formation of micropores in the material, the occurrence of partial discharge) are analyzed from the microscopic point of view. The aging and destruction of insulation materials due to the initiation and growth of electric dendrites. The insulation aging life model based on space charge effect is expected to be used to evaluate the insulation aging life under DC. In the future, the research on insulation life model should be changed from macro to micro. With the help of various advanced macroscopic and microscopic observation and analysis methods, the simulation and experiment should be closely combined, and the dynamic analysis method should be used to establish the insulation aging life model with clear physical meaning and accurate failure time.
【作者单位】：西安交通大学电力设备电气绝缘国家重点实验室;
【基金】：国家自然科学基金(51377131)~~
【分类号】：TM21

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