基于锁相红外热成像技术的硅太阳能电池无损检测的研究

发布时间：2018-06-23 08:28

本文选题：锁相热成像 + 硅太阳能电池　；参考：《渤海大学》2016年硕士论文

【摘要】：在能源危机与温室效应日益严重的今天,太阳能电池作为一种绿色能源在生产和生活中得到了广泛的应用,在太阳能电池的生产工艺中,缺陷检测技术扮演着重要的角色。因此,太阳能电池的无损检测技术拥有着十分重要的研究意义。本课题选用了单晶硅、多晶硅与薄膜硅三种不同效率的太阳能电池作为研究对象,从硅太阳能电池的基本结构、光电特性以及制作工艺等角度对缺陷进行了说明和分类,还介绍了几种常用的太阳能电池的检测方法,并对其原理及特点进行比较,选用了一种行之有效的检测太阳能电池缺陷的无损检测技术——锁相红外热成像检测技术。本课题采用了两种锁相红外热成像技术对硅太阳能电池的缺陷进行了检测与分析,一种是暗电流锁相红外热成像检测技术(DLIT),即对太阳能电池加0.5 V的正反偏压,通过对比热像图判断线性与非线性漏电流,继续加0-30 V的反向偏压,对比缺陷区域的变化,并对缺陷区域做具体分析；另-种是光锁相红外热成像检测技术(ILIT),即在DLIT检测技术的基础上分别加LED灯、850 nm的红外灯光照射,对比两种光照条件下检测到的热像图,并与DLIT检测到的热像图进行对比,分析缺陷产生的原因。同时还可通过检测电池样品表面温度随时间变化的图像来分析缺陷的特征。此外,通过对振幅与相位的计算,确定缺陷的深度与尺寸。再用Corescan检测仪对样品进行检测,分析串并联电阻与漏电流的关系,对比热像仪检测到的热像图与Corescan检测到的串并联电阻图,验证本课题检测技术的准确性与有效性。
[Abstract]:In the energy crisis and Greenhouse Effect increasingly serious today, solar cells as a green energy in production and life has been widely used, in the production process of solar cells, defect detection technology plays an important role. Therefore, the nondestructive testing technology of solar cells has a very important significance. Three kinds of solar cells with different efficiency such as monocrystalline silicon, polycrystalline silicon and thin film silicon are selected as the research objects in this paper. The defects are explained and classified from the aspects of the basic structure, photoelectric characteristics and fabrication process of the silicon solar cells. This paper also introduces several commonly used detection methods of solar cells, compares their principles and characteristics, and selects a kind of effective nondestructive testing technology for detecting solar cell defects, which is phase-locked infrared thermal imaging detection technology. In this paper, two kinds of phase-locked infrared thermal imaging techniques are used to detect and analyze the defects of silicon solar cells. One is dark current phase-locked infrared thermal imaging (DLIT), that is, adding 0.5 V positive and negative bias voltage to solar cells. The linear and nonlinear leakage currents are judged by comparing the thermal images, and the reverse bias voltage of 0-30 V is added to compare the changes of the defect region, and the defect region is analyzed concretely. The other is the optical phase-locked infrared thermal imaging detection (ILIT), which is based on the DLIT detection technology, which is to add the LED lamp 850nm infrared light irradiation, compare the thermal images detected under the two kinds of illumination conditions, and compare with the thermal images detected by DLIT. Analyze the causes of defects. At the same time, the defect characteristics can be analyzed by detecting the image of the surface temperature of the battery sample changing with time. In addition, the depth and size of the defect are determined by calculating the amplitude and phase. The relationship between the series and parallel resistance and leakage current is analyzed by using Corescan detector. The accuracy and validity of the detection technique are verified by comparing the thermal images detected by the thermal imager and the series and parallel resistance diagrams detected by Corescan.
【学位授予单位】：渤海大学
【学位级别】：硕士
【学位授予年份】：2016
【分类号】：TM914.4

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