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一种恒流模式高级多功能集成负载开关的设计

发布时间:2018-03-13 02:12

  本文选题:电源路径管理 切入点:开关通路 出处:《复旦大学》2014年硕士论文 论文类型:学位论文


【摘要】:近年来,基于电池供电系统和USB兼容供电系统的便携式电子产品发展势头非常强劲。但是由于电池技术发展比较缓慢,USB驱动负载能力受限,以及越来越多的子系统需要分时供电,传统的PMIC的供电通道数量以及供电的质量已经不能够满足现代消费类电子产品中对供电资源进行有效管理和高效率利用的需求。因此,电源路径管理中开关通路的设计变得尤为重要,其中高级多功能负载开关由于自身集成的保护功能齐全,静态功耗低,物理尺寸小以及配置灵活而被广泛应用于便携式电子产品的电源管理解决方案中。本文研究和设计了一款基于混合信号硅基互补氧化物(Complementary Metal-oxide Silicon, CMOS)工艺的,用于便携式电子产品中电源通路管理的高级多功能集成负载开关芯片。论文的研究和设计围绕低功耗、低成本、高精度、保护性能齐全以及具有简单方便可测试性等方面展开,从前期的系统定义、电路设计、仿真验证,到后期的版图设计以及芯片测试,完整的实现并测试了了所设计的芯片。由于需要实现低功耗,设计中避免了使用冗余的电路模块,使用中的电路模块也尽可能少的消耗电流,够用即可。出于成本的考虑,电路设计中尽可能的使用基于基本版图层次的元器件,避免使用需要额外制作层次的元器件,比如NPN型三极管可以用基于CMOS工艺的PNP型三极管来实现。由于需要实现高精度的过流保护,设计中采用了多处修调技术来完成这一指标。因为高集成度、多功能是负载开关的发展趋势,所以本设计中除了集成软启动浪涌电流保护、过温欠压锁定、可调恒流限流输出、自动重启以外,还设计了反向电流阻断保护的功能,并使其无关于功率开关管是导通状态还是截止状态。由于测试成本在整个集成电路芯片开发中的比重非常高,因此论文所设计的芯片中集成了一种可以简单方便进行芯片级筛选测试和封装后成品测试的测试模式,涵盖了几乎所有的基本电路模块性能测试,方便了测试纠错。
[Abstract]:In recent years, portable electronic products based on battery power supply system and USB compatible power supply system are developing very strongly. However, due to the slow development of battery technology, the capacity of USB driver is limited. As more and more subsystems need time-sharing power supply, the quantity of power supply channels and the quality of power supply of traditional PMIC can not meet the demand of effective management and efficient utilization of power supply resources in modern consumer electronic products. The design of switch path in power path management has become particularly important, among which the advanced multifunctional load switch has low static power consumption due to its integrated protection functions. Small physical size and flexible configuration are widely used in power management solutions for portable electronic products. This paper studies and designs a hybrid Si-based complementary Metal-oxide Silicon (CMOS) process. Advanced multifunctional integrated load switch chip for power path management in portable electronic products. The research and design of this paper focus on the aspects of low power consumption, low cost, high precision, complete protection performance, simple and convenient testability, etc. From the previous system definition, circuit design, simulation verification, layout design and chip test, the designed chip is implemented and tested. Because of the need to achieve low power consumption, redundant circuit modules are avoided in the design. Circuit modules in use also consume as little current as possible, enough. For cost reasons, use components based on the basic layout level as much as possible in circuit design, avoiding the use of components that require additional layers of fabrication. For example, NPN Triode can be realized by using PNP Triode based on CMOS process. Because of the need to realize high precision overcurrent protection, the design adopts multi-place modification technology to accomplish this target, because of the high integration level, Multifunction is the development trend of load switch, so in this design, in addition to integrating soft start surge current protection, over-temperature and under-voltage locking, adjustable constant current current limiting output, automatic restart, the function of reverse current blocking protection is also designed. And makes it irrelevant to whether the power switch is on or off. Because the test cost is very high in the whole IC chip development, Therefore, the chip designed in this paper integrates a test mode which can be easily used for chip-level screening test and packaged product test, which covers almost all the basic circuit module performance tests and facilitates the test error correction.
【学位授予单位】:复旦大学
【学位级别】:硕士
【学位授予年份】:2014
【分类号】:TM564

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1 方明;姚若河;;基于施密特比较器的高可靠上电复位电路[J];微电子学;2010年05期

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1 崔强;集成电路中ESD防护研究[D];浙江大学;2008年



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