终端短路法材料介电性能变温测试技术研究

发布时间：2018-07-06 12:04

  本文选题：微波材料 + 变温测试　； 参考：《电子科技大学》2014年硕士论文

【摘要】：在航天航空、军事、医疗等众多领域中,微波材料的应用随处可见。一般来说,大部分的微波材料只要求在常温环境下完成工作即可。然而,当处于几百度甚至上千度的工作环境中时,微波材料的复介电常数会随着温度变化呈现非线性变化,如果不能准确了解这些材料的性能,正确地使用微波材料,这将会对微波材料设备产生不可估量的影响。因此,建立一套材料介电性能变温测试系统,准确测试不同微波材料在不同温度及不同频率下的介电性能变化,为微波材料设备的生产提供数据参考,具有非常重要的价值。本文以经典的终端短路法测试理论为基础,对传统的终端短路法测试结构进行了改进创新。其中主要体现在两个方面：第一,高方向性定向耦合器的加入,简化了方向性误差校准,同时保证了测试精度。第二,在结构中加入波导开关,利用响应校准,可以起到实时校准的作用,特别是在本测试系统中,可大大提高测试实验的重复性。本文设计制作了本测试结构中所需的同轴-矩形波导模式转换器、定向耦合器、高温波导等微波器件,完成测试系统组建。以测试系统为核心,对真空装置、感应加热装置、水冷机、温控设备等各子系统进行联调工作,完成材料介电性能变温测试系统的搭建。在频率15 GHz附近利用自动化测试软件实现了室温～1200℃微波材料介电常数的变温测试。根据测试结果分析,本变温测试系统达到了如下技术指标：测试频率：15 GHz及附近频点(Ku Band)测试温度：常温～1200℃测试范围：室温：εr'=1.0～12 tanδε=0.001～0.11200℃:εr=1.0～12 tanδε=0.005～0.1误差范围：室温：|Δεr'/εr'|≤5% |Δtan δε/tanδε|≤14% tan δε+0.001 1200℃:|Δεr'/εr'|≤10% |Δtan δε/tanδε|≤28% tanδε+0.002
[Abstract]:In aerospace, military, medical and many other fields, microwave materials can be seen everywhere. Generally speaking, most microwave materials only require that work be done under normal temperature. However, the complex permittivity of microwave materials varies nonlinear with temperature when they are in a working environment of several degrees or even thousands of degrees. If the properties of these materials cannot be accurately understood, the microwave materials can be used correctly. This will have an incalculable effect on microwave material equipment. Therefore, it is of great value to establish a system for measuring the dielectric properties of different microwave materials at different temperature and frequency, and to provide data reference for the production of microwave materials. Based on the classical theory of terminal short circuit test, the traditional test structure of terminal short circuit method is improved and innovated in this paper. First, the addition of high directional coupler simplifies the calibration of directional errors and ensures the accuracy of the measurement. Secondly, the waveguide switch is added to the structure and the response calibration is used, which can play the role of real-time calibration, especially in this testing system, which can greatly improve the repeatability of the test experiment. In this paper, the coaxial rectangular waveguide mode converter, directional coupler, high temperature waveguide and other microwave devices are designed and fabricated, and the test system is constructed. Taking the test system as the core, the subsystems such as vacuum device, induction heating device, water cooler, temperature control equipment and so on are combined to complete the construction of the material dielectric property temperature change test system. The dielectric constant of microwave materials at room temperature of 1200 鈩，

本文编号：2102730