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微波介电常数测量系统的误差分析及改进方法研究

发布时间:2018-08-21 13:55
【摘要】:近年来,微波元器件在无线通信技术、遥感以及航空航天等高科技领域得到了广泛的应用,而材料的介电常数又在其中起着关键的作用。但随着温度和频率变化,材料的介电常数通常会发生变化,最终导致微波元器件的设计参数发生改变。所以对测量得到的介电常数进行误差分析与改进方法研究不仅能有效地评估介电常数测量结果,还可提出改善测量结果的途径,为微波元器件、电子电路及系统的研制提供保障。本文主要以宽频段内(1~39GHz)微波介电常数测量系统的误差分析及改进为研究对象。首先对目前材料介电常数常用的测量方法进行了简要介绍,并重点分析研究了传输/反射法与开口同轴探针法测量介电常数的原理,为介电常数测量系统的构建奠定了理论基础。针对宽频段内介电常数的测量,本文确定了采用传输/反射法与开口同轴探针法分频段构建介电常数测量系统的方案,其中传输/反射法测量系统又分为同轴与波导传输线测量系统;另外为了能在传输线测量系统中测量粉末材料的介电常数,采用了聚四氟乙烯垫片进行固定的方案;在此基础上本文还分别对所构建的测量系统的校准进行了分析;通过对几种常见材料的介电常数测量表明了所构建的测量系统是可行、有效的。本文还分别根据测量原理确定了传输线测量系统与开口同轴探针测量系统的各种误差源,并对此进行了深入研究。在传输线测量系统中,根据测量原理采用微分法详细的推到了误差计算公式;在开口同轴探针测量系统中,采用数值法计算最大误差,从而完成了传输线测量系统与开口同轴探针测量系统较为全面的误差分析。通过对测量误差的模拟计算,确定了对介电常数测量结果影响较大的误差源;最后分别对影响介电常数测量结果的误差源,提出了降低测量误差及改善测量结果的途径。通过上述的研究,本文很好地完成了宽频段内微波介电常数测量系统的测量及其误差分析与改进。此外本文采用的计算介电常数的模型与误差分析计算程序皆可应用于更高频段的测量系统,为进一步研究奠定了基础。
[Abstract]:In recent years, microwave components have been widely used in wireless communication, remote sensing, aerospace and other high-tech fields, and the dielectric constant of materials plays a key role. However, with the change of temperature and frequency, the dielectric constant of the material usually changes, which leads to the change of the design parameters of microwave components. Therefore, the error analysis and improvement method of the dielectric constant obtained from the measurement can not only effectively evaluate the measurement results, but also provide a way to improve the measurement results, that is, microwave components. The development of electronic circuit and system provides guarantee. In this paper, the error analysis and improvement of microwave dielectric constant measurement system in wide band (1~39GHz) are studied. In this paper, the current methods of dielectric constant measurement are briefly introduced, and the principle of transmission / reflection method and open coaxial probe method for dielectric constant measurement is analyzed and studied. It lays a theoretical foundation for the construction of dielectric constant measurement system. Aiming at the measurement of dielectric constant in wide band, the scheme of using transmission / reflection method and open coaxial probe method to construct the dielectric constant measurement system is proposed in this paper. The transmission / reflection measurement system is divided into coaxial and waveguide transmission line measurement system. In addition, in order to measure the dielectric constant of powder material in the transmission line measurement system, PTFE gasket is used to fix the system. On this basis, the calibration of the measurement system is analyzed, and the dielectric constant measurement of several common materials shows that the measurement system is feasible and effective. In this paper, the error sources of transmission line measurement system and open coaxial probe measurement system are determined according to the measuring principle, and the error sources are deeply studied. In the transmission line measurement system, the differential method is used to calculate the error in detail according to the measuring principle, and the numerical method is used to calculate the maximum error in the open coaxial probe measurement system. Thus, the error analysis of transmission line measurement system and open coaxial probe measurement system is completed. Through the simulation calculation of the measurement error, the error source which has a great influence on the measurement results of dielectric constant is determined, and the ways to reduce the measurement error and to improve the measurement result are put forward respectively for the error source that affects the measurement result of dielectric constant. Based on the above research, the measurement of microwave dielectric constant in broadband band and its error analysis and improvement have been completed in this paper. In addition, both the model of calculating dielectric constant and the calculation program of error analysis can be applied to the measurement system in higher frequency band, which lays a foundation for further research.
【学位授予单位】:电子科技大学
【学位级别】:硕士
【学位授予年份】:2014
【分类号】:TM934.33

【参考文献】

相关期刊论文 前1条

1 王政平;任维赫;;材料复介电常数测量方法研究进展[J];光学与光电技术;2011年01期



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