新型激光全息防伪标识特性参数测量研究

发布时间：2018-01-06 05:33

本文关键词：新型激光全息防伪标识特性参数测量研究　出处：《湖北工业大学》2015年硕士论文　论文类型：学位论文

【摘要】：激光全息技术在防伪领域的应用被称为全息防伪,它被广泛用于医药、食品、以及机要证卡、电子产品商标以及奢侈品等上的防伪标识,由于这样的防伪标识性能稳定,且造型精美、不易复制,因此在防伪行业中占据着非常重要的位置。但由于全息生产行业过于迅猛无序地发展,很多质量参差不齐的全息防伪标识被制作出来,使消费者很难识别产品的真假,并且也严重威胁了正品生产厂家的生产利益。因此为了充分发挥全息防伪标识的防伪能力,需要对防伪产品的制作质量进行检测和把关。在已有的国家检测标准中,被用于表征全息防伪标识制作质量好坏的特性参数主要是衍射效率和信噪比。起初被广泛应用的全息防伪标识是用两步法制成的彩虹全息图,GB/T17000-1997((防伪全息产品通用技术条件》给出了其特性参数的测量方法,并且已有比较成熟的测量仪器。随着计算机的广泛应用和直写技术的发展,很多新型的全息图如点阵全息图和基于SLM产生的面阵全息图被应用于防伪行业。为了对此类新型标识的特性参数进行准确、简单、快速的测量,并为以后形成完善的测量仪器打下基础,本文主要做了以下工作:本论文以激光全息防伪标识的特性参数测量研究为主要目的,首先对激光全息防伪技术的特点和发展进行了介绍,然后通过比较彩虹全息防伪标识和新型的点、面阵全息图的制作原理,分析论证了彩虹全息图特性参数测量方法不适用于新型的防伪标识。为了能对新型的防伪标识特性参数进行精确测量,本论文设计了一套集光路、电路及软件在内的系统,实现了光电转换、数据采集、A/D转换以及数据显示和存储等功能。利用设计的系统对60枚点、面阵全息防伪标识的特性参数进行了测量,入射光强的测量误差低于0.2%,由于激光器功率不稳所带来的系统测量误差被减小,测量成本降低,为更加成熟的标识特性参数测量方法和新的国家标准的形成提供了理论和实践基础。
[Abstract]:The application of laser holography technology in the field of anti-counterfeiting is called holographic anti-counterfeiting, it is widely used in medicine, food, as well as confidential card, electronic products trademark and luxury goods. Because this kind of anti-counterfeiting marking has stable performance and exquisite shape, it is difficult to copy, so it occupies a very important position in the anti-counterfeiting industry. However, the holographic production industry is developing too fast and disorderly. Many different quality holographic anti-counterfeiting marks have been made, making it difficult for consumers to identify the true and false products. And also seriously threatened the production interests of genuine manufacturers. So in order to give full play to the anti-counterfeiting ability of holographic marking. The quality of anti-counterfeiting products need to be tested and checked. In the existing national test standards. Diffraction efficiency and signal-to-noise ratio (SNR) are the main characteristic parameters used to characterize the quality of holographic anti-counterfeiting marking. At first the widely used holographic anti-counterfeiting mark is a rainbow hologram made by two-step method. GB / T 17000-1997 (General Technical conditions for Anti-counterfeiting holographic products) the measurement method of its characteristic parameters is given. With the wide application of computer and the development of direct writing technology, there are already relatively mature measuring instruments. Many new holograms, such as dot matrix holograms and plane array holograms based on SLM, are used in anti-counterfeiting industry. And lay a foundation for the formation of a perfect measuring instrument in the future. The main work of this paper is as follows: the main purpose of this paper is to measure the characteristic parameters of laser holographic anti-counterfeiting marking. Firstly, the characteristics and development of laser holographic anti-counterfeiting technology are introduced. Then, by comparing rainbow holographic anti-counterfeiting marking and new points, the principle of making plane array holograms is introduced. It is proved that the method of measuring the characteristic parameters of rainbow hologram is not suitable for the new anti-counterfeiting marking. In order to accurately measure the characteristic parameters of the new anti-counterfeiting mark, this paper designs a set of lumped light path. The system includes circuit and software, which realizes the functions of photoelectric conversion, data acquisition, A- / D conversion, data display and storage, etc. The designed system is used to set up 60 points. The measurement error of incident light intensity is less than 0.2. The system measurement error caused by the instability of laser power is reduced and the measurement cost is reduced. It provides a theoretical and practical basis for more mature measurement methods of marking characteristic parameters and the formation of new national standards.
【学位授予单位】：湖北工业大学
【学位级别】：硕士
【学位授予年份】：2015
【分类号】：TN249

【参考文献】