基于OVM的功能覆盖率驱动模块实现

发布时间：2018-01-19 02:01

本文关键词： 功能覆盖率 OVM System Verilog 验证平台自动化　出处：《西安电子科技大学》2015年硕士论文　论文类型：学位论文

【摘要】：本论文的研究重点是数字集成电路设计中的验证技术。随着集成电路技术的高速发展,芯片设计的规模越来越大,功能越来越复杂,导致在电路设计阶段设计缺陷出现的可能性越来越高,于是对验证的要求越来越高。并且现在芯片的应用领域越来越广泛,对设计安全性的要求也越来越高,设计漏洞的出现可能会造成非常严重的后果,验证的充分性也显得尤为重要。市场对芯片产品更新换代的要求也越来越快,而在大规模集成电路开发的前端设计流程中,验证工作已经占到了总工作量的百分之七十左右。如何在保证验证充分性的前提下,提高验证效率成为集成电路设计开发中的瓶颈。找到高效、可行的验证方法非常重要。本文在详细对比分析了传统的定向验证方法、带约束的随机化激励验证方法以及基于覆盖率驱动的验证方法的基础上,针对当前验证工作面临的完备性、可重用性、可靠性和效率等方面的挑战,结合基于功能覆盖率驱动的验证方法和OVM验证方法学,设计实现了功能覆盖率驱动器组件。论文所设计的功能覆盖率驱动组件实现了功能覆盖率的动态自动化分析,可根据分析结果指导验证平台中的序列产生器产生有针对性的测试激励,并易于集成到OVM架构的验证环境中。该模块基于功能覆盖率驱动的验证方法,实现了验证的完备性;基于OVM验证方法学和System Verilog语言,模块化实现了设计内容及高度的可重用性;设计了自动化的实现手段,减少了人为参与过程,提高了验证的可靠性;以反馈方式调控验证环境中随机测试激励的生成,减少了重复性验证行为,加速了功能覆盖率收敛,提高了验证效率。同时,该功能覆盖率模块封装成一个独立功能模块,易于集成到不同的验证环境,提升了可移植性。论文最后以SOC芯片上DebugTrace系统中一个典型模块的验证过程为例,将功能覆盖率驱动模块集成到了该模块的OVM验证平台中并进行仿真,通过对比不同时刻功能覆盖率的覆盖情况得到了功能覆盖率的收敛曲线。对比结果表明采用本文所设计的功能覆盖率驱动模块使功能覆盖率的收敛速度提高了50%以上。
[Abstract]:With the rapid development of integrated circuit technology, the scale of chip design is becoming larger and larger, and the function is becoming more and more complex. As a result, the possibility of design defects in the circuit design phase is becoming higher and higher, so the requirement of verification is becoming higher and higher. And now the application field of chip is more and more extensive, and the requirement of design security is also more and more high. The emergence of design loopholes may cause very serious consequences, the adequacy of verification is also particularly important. The market for chip products upgrading requirements are also getting faster and faster. In the front-end design process of large-scale integrated circuit development, verification work has accounted for about 70% of the total workload. How to ensure the adequacy of verification under the premise. Improving the efficiency of verification has become the bottleneck in IC design and development. It is very important to find efficient and feasible verification methods. In this paper, the traditional directional verification methods are compared and analyzed in detail. Based on the randomized incentive verification method with constraints and the coverage driven verification method, this paper aims at the challenges of completeness, reusability, reliability and efficiency faced by the current verification work. Combining the functional coverage driven verification method with the OVM verification methodology. The functional coverage driver component is designed and implemented. The functional coverage driver component designed in this paper realizes the dynamic automatic analysis of the function coverage. According to the analysis results, the sequence generator in the verification platform can generate targeted test incentives, and can be easily integrated into the verification environment of OVM architecture. This module is based on the functional coverage driven verification method. The completeness of verification is realized. Based on OVM verification methodology and System Verilog language, the design content and high reusability are realized by modularization. The realization method of automation is designed to reduce the process of artificial participation and improve the reliability of verification. The generation of random test incentives in the verification environment is regulated by feedback, which reduces the repetitive verification behavior, accelerates the convergence of function coverage, and improves the efficiency of verification. The functional coverage module is encapsulated into a separate functional module, which is easy to integrate into different verification environments. Finally, the verification process of a typical module in DebugTrace system on SOC chip is taken as an example. The function coverage driver module is integrated into the OVM verification platform of the module and simulated. The convergent curve of function coverage is obtained by comparing the coverage of function coverage at different times. The comparison results show that the convergent speed of function coverage is improved by using the function coverage driver module designed in this paper. More than 0%.
【学位授予单位】：西安电子科技大学
【学位级别】：硕士
【学位授予年份】：2015
【分类号】：TN402

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