基于微桥结构的太赫兹探测器测试技术研究

发布时间：2018-01-28 11:12

本文关键词： 微桥结构太赫兹探测器测试系统参数测试成像显示自动化　出处：《电子科技大学》2015年硕士论文　论文类型：学位论文

【摘要】：太赫兹波时指频率在0.1-10THz之间的电磁波,近年来,由于太赫兹辐射源的研发,太赫兹技术越来越受到人们的关注。结合非制冷红外焦平面探测器研制技术,微桥结构的太赫兹探测器的制备也越来越受到国内外重要研究机构的重视。基于此,本文主要的工作为研制一套能够进行太赫兹焦平面探测器性能参数的测试和图像显示的测试系统。对于太赫兹探测器测试系统,本论文主要从硬件和软件两个部分进行设计。硬件部分主要为探测器提供一个良好的工作环境,高速的数据传输方式;软件部分主要为系统提供简洁明了的软件框架设计,高效的算法设计。从这两个方面保证测试系统能够进行大面阵太赫兹焦平面探测器的性能参数测试以及实时的太赫兹探测器图像显示功能。具体实现上,本文进行的主要工作如下,首先分析了微桥结构太赫兹探测器的工作原理,太赫兹辐射源的工作原理,参照红外探测器测试参数以及太赫兹单元测试方法,提出了太赫兹探测器的性能参数测试原理和方法,包括的主要参数有响应率、噪声等效功率、响应的非均匀性和盲元率。参照性能参数的测试需求,提出了测试系统的设计方案。系统设计方案包括太赫兹探测器测试系统的硬件设计,时序驱动电路、数模转换电路、偏置电压电路、数据采集电路;PCIE(高速总线接口)驱动设计,包括PCIE驱动设计、驱动程序与应用程序交互、FPGA(可编程门阵列)与计算机间进行数据采集;太赫兹探测器性能参数计算的软件设计;太赫兹图像校正与增强,包括非均匀性校正、盲元补偿、直方图均衡化;自动化操作,包括自动调节偏置电压,测试系统数据、报表的记录、保存与导出。太赫兹探测器测试系统能够稳定工作,满足焦平面阵列参数测试的要求,同时实时成像功能也能够满足系统要求。本系统还具备操作简单、系统稳定、自动化功能高、可扩展性强等特点。
[Abstract]:Terahertz time refers to electromagnetic waves with frequencies between 0.1-10THz. In recent years, due to the development of terahertz radiation sources. The terahertz technology has attracted more and more attention. The uncooled infrared focal plane detector has been developed. The fabrication of micro-bridge terahertz detectors has been paid more and more attention by domestic and foreign important research institutions. The main work of this paper is to develop a test system which can test the performance parameters of THz focal plane detector and display the image. This paper mainly designs from two parts: hardware and software. The hardware provides a good working environment and high speed data transmission mode for the detector. The software part mainly provides the concise software frame design for the system. Efficient algorithm design. From these two aspects to ensure that the test system can test the performance parameters of large array terahertz focal plane detector and the real-time image display function of terahertz detector. The main work of this paper is as follows: firstly, the principle of the micro-bridge terahertz detector and the terahertz radiation source are analyzed. The parameters of the infrared detector and the terahertz unit test method are referred to. The principle and method of testing performance parameters of terahertz detector are presented, including the main parameters such as response rate, noise equivalent power, nonuniformity of response and blind element rate. The design scheme of the test system includes the hardware design of terahertz detector test system, timing drive circuit, digital-analog conversion circuit, bias voltage circuit and data acquisition circuit. The design of high speed bus interface driver includes the design of PCIE driver, and the data acquisition between the driver and the application program, FPGA (Programmable Gate Array) and the computer. Software design for calculating the performance parameters of terahertz detector; Terahertz image correction and enhancement, including nonuniformity correction, blind element compensation, histogram equalization; Automatic operation, including automatic adjustment of bias voltage, test system data, record of report form, save and export. Terahertz detector test system can work stably and meet the requirements of focal plane array parameter testing. At the same time, the real-time imaging function can also meet the requirements of the system. The system also has the characteristics of simple operation, stable system, high automation function, strong scalability and so on.
【学位授予单位】：电子科技大学
【学位级别】：硕士
【学位授予年份】：2015
【分类号】：TP274;O441.4

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