基于多种群改进量子进化算法的3D NoC测试功耗优化

发布时间：2018-02-27 08:22

本文关键词： 三维片上网络测试功耗量子进化算法优体交叉多种群　出处：《微电子学与计算机》2017年08期 　论文类型：期刊论文

【摘要】：针对在测试过程中芯片产生较大的热效应会破坏芯片的可靠性,本文在进行测试规划获得最短测试时间的基础上,将测试时间作为约束,采用多种群改进量子进化算法优化测试功耗,以降低测试成本,防止功耗过高造成芯片不可逆的损坏.算法中,为了避免单一种群不能保证种群多样性,将多种群操作与算法相结合,并引入优体交叉策略,以提高算法的全局寻优能力.以ITC’02基准电路作为实验对象,实验结果表明,该算法能迅速收敛到最优解,缩短了测试时间,提高了测试效率,并在测试时间约束下,优化了测试功耗.
[Abstract]:The reliability of large thermal effect will damage the chip to chip in the testing process, based on the test plan to get the short test time, test time as a constraint, an improved multi swarm quantum evolutionary algorithm to optimize the test power, in order to decrease the test cost, power consumption is too high to prevent damage caused by irreversible chip algorithm. In order to avoid a single population, can not guarantee the diversity of the population, combining multiple operations and algorithms, and introduces the advantages of crossover strategy, which improves the global searching ability. With the ITC 02 benchmark circuits as the experimental object, the experimental results show that the algorithm can quickly converge to the optimal solution, shorten the test time and improve testing efficiency, and in the test under time constraints, optimize the test power.

【作者单位】：桂林电子科技大学电子工程与自动化学院;广西自动检测技术与仪器重点实验室;
【基金】：国家自然科学基金资助项目(61561012)
【分类号】：TN407;TP18

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