双光路互参考高精度AOTF衍射效率测试方法及装置

发布时间：2018-03-09 03:09

本文选题：测试方法　切入点：双光路互参考　出处：《红外与激光工程》2017年04期 　论文类型：期刊论文

【摘要】：适应现代光电检测技术对微弱光电信号测量精度的进一步追求,提出并验证双光路互参考高精度AOTF衍射效率测试方法。该方法利用光路可切换器件实现光路互参考检测,从而达到降低光源不稳定性、探测器响应差异性及光电干扰的目的,有效提高测试精度。首先对双光路互参考高精度AOTF测试方法的原理进行具体阐述,然后说明建立的针对AOTF衍射效率测量的双光路互参考探测实验装置并对其进行实验验证。分析及试验结果表明:采用互参考技术可使衍射效率测量方法数据精确度平均提高50%,有效降低光源不稳定性、探测器响应差异性的影响,实现提高测试精度的目的,最后对方法的适用范围及参考意义进行了分析及讨论。
[Abstract]:According to the further pursuit of the measurement accuracy of the weak photoelectric signal by modern photoelectric detection technology, a high precision AOTF diffraction efficiency measurement method with double optical path cross-reference is proposed and verified. This method uses the optical path switchable device to realize the optical path cross-reference detection. In order to reduce the instability of the light source, the difference of the detector response and the photoelectric interference, the measurement accuracy is improved effectively. Firstly, the principle of the dual-path cross-reference high-precision AOTF testing method is expounded in detail. Then, the dual optical cross-reference detection device for measuring the diffraction efficiency of AOTF is established and verified experimentally. The analysis and experimental results show that the measurement data of diffraction efficiency can be accurate by using cross-reference technique. An average increase of 50 degrees can effectively reduce the instability of the light source. The purpose of improving the accuracy of the detector is realized by the effect of the difference of the detector response. Finally, the scope of application and reference significance of the method are analyzed and discussed.
【作者单位】：中国科学院上海技术物理研究所中国科学院空间主动光电技术重点实验室;
【基金】：国家自然科学基金(21105109)
【分类号】：O436.1;TN29

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