模拟电路自动测试程序生成系统的研究与实现

发布时间：2018-03-23 10:16

本文选题：模拟电路故障诊断　切入点：测试程序集　出处：《北方工业大学》2015年硕士论文

【摘要】：近年来,因为科技与信息化产业的发展,现代的电子设备对于精确度与复杂度要求越来越高,设备中内置的电路板的精密性与复杂度飞速提升,相应的模拟电路的功能测试与故障诊断环节的重要性被认为是一款设备是否稳定,是否优秀的重要标准。在模拟电路功能测试与故障诊断中,测试程序集(Test Program Set,简称TPS)是决定测试效率与诊断率的重要核心,因此,在模拟电路故障领域中,一款TPS与其相应的配套环境的性能将直接决定电路板以及电子装备的性能。所以在设计与研发电子产品中,自主研发出一套高效的,自动的TPS对于模拟电路领域是尤为重要并且亟待解决并且提高的重要环节。本文在VisioStudio2010环境下使用C++语言设计并且实现了模拟电路自动测试程序生成系统。本系统基于IEEE1232协议,实现了测试程序集的自动化,详细给出了针对模拟电路的功能测试与故障诊断的方法：通过将IEEE1232给出的AI-ESTATE模型进行扩充,增添人工免疫系统模型(Artificial Immune System Model,简称AISM),神经网络模型(Back Propagation Model,简称BPM),支持向量机模型(Support Vector Machine Model,简称SVMM)于AI-ESTATE中,本系统通过调用各种模型完成功能测试与故障诊断,并且通过对IEEE1232提出的故障树模型进行匹配,融合SVM算法,设计并且实现了模拟电路故障树的自动生成,在故障诊断中能够导入PCB模型并且显示错误器件,最后通过调用Word自动生成相关Word文档实现自动生成报表功能。通过测试表明,该系统能够替代以往通过人工知识手动进行测试的决策树方法,能够提高测试效率,具有操作简单,测试成功率与稳定性较原来的测试程序相比有所提高。本文研发的模拟电路自动测试程序生成系统实现了上述的功能,并且顺利通过测试实验证明的本系统的可行性与适用性。
[Abstract]:In recent years, due to the development of science and technology and information industry, modern electronic devices require more and more precision and complexity. The importance of functional testing and fault diagnosis of analog circuits is considered to be an important standard of whether the equipment is stable and excellent. In the functional testing and fault diagnosis of analog circuits, Test Program Settings (TPSs) are the core of testing efficiency and diagnostic rate. Therefore, in the field of analog circuit fault, The performance of a TPS and its corresponding supporting environment will directly determine the performance of circuit boards and electronic equipment. Automatic TPS is an important step in analog circuit field. This paper uses C language to design and realize the automatic test program generation system of analog circuit in VisioStudio2010 environment. Based on IEEE1232 protocol, the system realizes the automation of test assembly. The methods of function test and fault diagnosis for analog circuits are given in detail. By extending the AI-ESTATE model given by IEEE1232, The artificial Immune System Model (AIS), the Neural Network Model (BP Propagation Model) and the support Vector Machine Model (support Vector Machine Model) are added to the AI-ESTATE. The system completes the function test and fault diagnosis by calling various models. By matching the fault tree model proposed by IEEE1232 and merging the SVM algorithm, the automatic generation of fault tree in analog circuit is designed and realized. The fault tree can be imported into PCB model and error devices can be displayed in fault diagnosis. Finally, by calling Word to automatically generate relevant Word documents, the function of generating reports automatically is realized. The test results show that the system can replace the decision tree method of manual testing by manual knowledge, and can improve the efficiency of testing. With simple operation, the test success rate and stability compared with the original test program has been improved. The automatic test program generation system of analog circuit developed in this paper has realized the above functions, and the feasibility and applicability of the system have been proved by the test experiment.
【学位授予单位】：北方工业大学
【学位级别】：硕士
【学位授予年份】：2015
【分类号】：TN710

【参考文献】