0.35μm CMOS工艺的品质因数时域测量电路

发布时间：2018-04-05 07:25

本文选题：品质因数　切入点：时域测量　出处：《西安电子科技大学学报》2017年02期

【摘要】：基于品质因数的时域测量方法,提出了一种新的可以片上集成的品质因数测量电路,不仅在特定频率能实现品质因数的精确测量,还可在保持电路精度的前提下,覆盖一定待测信号的频带.在采用之前提出的可重构电路的基础上,改进了峰值探测器的补偿方式,进行了系统精度和扩频所需的理论分析,有效指导了电路的设计.另外,数字控制逻辑的改进,将总功耗降低7.5%.并通过集成电路的方式在0.35μm CMOS工艺下实现此电路,在电源电压为5V,输入信号频率为1MHz的条件下,实现品质因数的相对误差小于±0.2%,并且在精度不变的情况下,将待测信号的频段扩展到100kHz~1.5MHz.
[Abstract]:Based on the time domain measurement method of quality factor, a new quality factor measuring circuit which can be integrated on a chip is proposed. It can not only realize the accurate measurement of quality factor at specific frequency, but also maintain the accuracy of the circuit.The frequency band that covers a certain signal to be tested.On the basis of the reconfigurable circuit proposed before, the compensation method of peak detector is improved, and the theoretical analysis of system precision and spread spectrum is carried out, which effectively guides the design of the circuit.In addition, the improvement of digital control logic reduces the total power consumption by 7.5.The circuit is realized by integrated circuit in 0.35 渭 m CMOS process. Under the condition that the power supply voltage is 5 V and the input signal frequency is 1MHz, the relative error of the quality factor is less than 卤0.2 and the precision is constant.The frequency band of the signal to be tested is extended to 100 kHz and 1.5 MHz.
【作者单位】：西安电子科技大学微电子学院;基础电子研究所巴黎第十一大学巴黎萨克雷大学;
【分类号】：TN432

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