基于分治策略的加法器测试向量生成技术

发布时间：2018-04-22 12:50

本文选题：集成电路测试 + 测试生成　；参考：《仪器仪表学报》2016年05期

【摘要】：为应对数据通道测试中向量生成计算复杂度的日益增长,针对加法器进行研究,提出了一种基于分治策略的加法器测试向量生成技术。首先将被测加法器电路分解为并发模块和顺序模块,分别生成对应这些模块故障全覆盖的测试向量子集,再将他们的输入信号映射为被测加法器电路的基本输入,经去除冗余向量后得到完整的测试向量集。给出的实验结果表明了该技术能有效地降低加法器测试向量生成的计算量,特别对于大规模加法器电路的测试生成,其效果更佳。
[Abstract]:In order to cope with the increasing computational complexity of vector generation in data channel testing, a test vector generation technique for adder based on divide-and-conquer strategy is proposed. First, the circuit of the tested adder is decomposed into concurrent modules and sequential modules, and the test vector subsets corresponding to the full fault coverage of these modules are generated, and then their input signals are mapped to the basic inputs of the adders circuit under test. After removing redundant vectors, the complete set of test vectors is obtained. The experimental results show that the proposed technique can effectively reduce the computational complexity of the test vector generation of the adder, especially for the test generation of the large-scale adder circuit.
【作者单位】：同济大学电子与信息工程学院;
【分类号】：TN707

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