面阵探测器相连缺陷元识别定位

发布时间：2018-05-14 00:32

本文选题：面阵探测器 + 相连缺陷元识别　；参考：《红外与毫米波学报》2017年02期

【摘要】：面阵探测器相连缺陷元的光电信号与正常元基本相同,因此采用现有面阵测试方法无法识别相连缺陷元.针对相连缺陷元的特点,提出了借助改变面阵探测器光电响应的方法来实现相连缺陷元的识别定位.实验结果表明,该方法使面阵探测器分为两个不同透过率探测单元,多元相连缺陷元响应电压是相对应的两个不同透过率探测单元响应电压之和的平均值.采用MATLAB软件对测试数据进行分析处理,分析结果清晰给出缺陷元诸如个数、形状和位置等详细信息.采用本方法面阵探测器相连缺陷元可以被显著识别定位.研究结果为今后的面阵探测器评测与可靠性提高提供了参考.
[Abstract]:The photoelectric signal of the connected defect element of the array detector is basically the same as that of the normal element, so it is impossible to identify the connected defect element by using the existing plane array test methods. According to the characteristics of the connected defect element, a method of identifying and locating the connected defect element by changing the photoelectric response of the array detector is proposed. The experimental results show that the array detector can be divided into two different transmittance detection units, and the response voltage of the multicomponent connected defect elements is the average of the sum of the response voltages of the two different transmittance detection units. The MATLAB software is used to analyze and process the test data, and the detailed information such as the number, shape and position of the defect elements are clearly given in the analysis results. Using this method, the defect elements connected with the area array detectors can be clearly identified and located. The results provide a reference for the future evaluation and reliability improvement of the area array detector.
【作者单位】：西北工业大学电子信息学院;中国空空导弹研究院;红外探测器技术航空科技重点实验室;
【基金】：航空创新基金(2011D01406)~~
【分类号】：TN215

【相似文献】