基于电流的芯片级集成电路故障诊断方法

发布时间：2018-06-09 12:38

本文选题：电流 + 芯片级　；参考：《科学技术与工程》2017年22期

【摘要】：随着芯片级集成电路规模的逐渐增大,电路结构越来越复杂。当前故障诊断方法利用电路状态对电路故障进行检测,检测精度低。为此,提出一种新的基于电流的芯片级集成电路故障诊断方法。选择动态电流对芯片级集成电路故障进行诊断,通过Haar小波函数对芯片级集成电路进行预处理。介绍了多重分形理论基础,给出动态电流多重分形谱的计算方法。针对正常芯片级集成电路的动态电流信号求出其多重分形谱,选择一组测试向量对待测芯片级集成电路进行动态电流检测,对得到的数据进行小波变换处理,求出不同尺度下动态电流小波系数的模极大值。依据小波系数模极大值求出多重分形谱,通过其和正常电路多重分形谱之间的差异判断该电路是否存在故障。实验结果表明,所提方法诊断精度高。
[Abstract]:With the increasing scale of IC, the structure of IC becomes more and more complex. The current fault diagnosis method uses the circuit state to detect the circuit fault, and the detection accuracy is low. Therefore, a new fault diagnosis method for IC based on current is proposed. The dynamic current is selected to diagnose the fault of chip level integrated circuit, and the chip level integrated circuit is preprocessed by Haar wavelet function. The basis of multifractal theory is introduced, and the calculation method of dynamic current multifractal spectrum is given. In view of the multifractal spectrum of the dynamic current signal of the normal chip level integrated circuit, a set of test vectors is selected to measure the dynamic current of the chip level integrated circuit, and the obtained data is processed by wavelet transform. The modulus maximum of the wavelet coefficients of dynamic current at different scales is obtained. According to the modulus maximum of wavelet coefficients, the multifractal spectrum is obtained, and the difference between the multifractal spectrum of the circuit and that of the normal circuit is used to determine whether there is a fault in the circuit. The experimental results show that the proposed method has high diagnostic accuracy.
【作者单位】：河南大学濮阳工学院;
【分类号】：TN407

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