基于多信号流图模型的诊断策略优化技术研究

发布时间：2018-06-16 23:57

本文选题：可测试性设计 + 多信号流图　；参考：《郑州大学》2015年硕士论文

【摘要】：随着高新技术的迅速发展,电子设备的结构和技术越来越复杂,给测试、诊断和维修带来了更大的挑战。可测性设计作为提高设备的可用度,减少系统全寿命费用的重要技术,日益受到人们的关注。基于多信号流图模型的可测性分析是目前比较有效的一种可测性设计方法,诊断策略优化设计作为其中的一项重要内容,在减少系统的故障诊断时间、维修人力、维修器材和保障费用,提高系统的战备完好性等方面具有重要的意义。诊断策略优化问题也就是故障检测和隔离时测试排序问题,其目的是要构建一种测试序列,以较小的测试代价快速的隔离系统故障状态。对此,国内外学者进行了大量的研究,在二值测试方面,已取得不少研究成果,但在多值测试方面还缺乏深入研究。本文针对二值测试的经典算法的不足做出了改进,并对多值测试的问题进行了研究。本文首先介绍了多信号流图的建模过程,根据电子设备的原理图,建立多信号流图模型,得到诊断策略优化设计需要的故障-测试依存矩阵。其次介绍了诊断策略优化技术的基本理论,并对二值测试的诊断策略优化设计问题进行研究,分析了二值测试下经典诊断策略优化算法(贪婪算法和AO*算法)的优劣,提出有限搜索AO*算法,通过实例仿真验证了改进的算法在诊断树的最优性和算法的效率上更有优势。然后,在此基础上,对多值测试的诊断策略优化设计问题进行研究,提出了基于霍夫曼编码的与或树启发式搜索算法,通过实例仿真验证了该算法在解决多值测试诊断策略优化问题上是可行的。最后,根据诊断策略优化算法的输入和输出要求,设计了可用于小型系统的图形界面,通过图形界面使操作更简单,输出结果更直观。
[Abstract]:With the rapid development of high and new technology, the structure and technology of electronic equipment are becoming more and more complex, which brings more challenges to testing, diagnosis and maintenance. Testability design, as an important technology to improve the availability of equipment and reduce the life cost of the system, has attracted more and more attention. The testability analysis based on multi-signal flow graph model is an effective design method for testability at present. The optimal design of diagnosis strategy is one of the important contents, which can reduce the time of fault diagnosis and maintain manpower. It is of great significance to maintain the equipment and support cost and improve the combat readiness of the system. The problem of diagnosis strategy optimization is called the problem of fault detection and test sequencing when isolation. The purpose of this problem is to construct a kind of test sequence to isolate the fault state of the system quickly with less test cost. A lot of research has been done by scholars at home and abroad, and a lot of research results have been made in the field of binary testing, but there is still a lack of further research in the field of multi-value testing. In this paper, the shortcomings of classical algorithms for binary testing are improved, and the problem of multivalued testing is studied. In this paper, the modeling process of multi-signal flow graph is first introduced. According to the schematic diagram of electronic equipment, the multi-signal flow graph model is established, and the fail-test dependency matrix for the optimal design of diagnosis strategy is obtained. Secondly, the basic theory of diagnostic strategy optimization technology is introduced, and the optimal design of diagnostic strategy for binary testing is studied, and the advantages and disadvantages of classical diagnostic strategy optimization algorithms (greedy algorithm and AO* algorithm) under binary test are analyzed. A finite search AO* algorithm is proposed. The simulation results show that the improved algorithm has more advantages in the optimality of the diagnostic tree and the efficiency of the algorithm. Then, on this basis, the optimal design of diagnosis strategy for multi-valued testing is studied, and a heuristic search algorithm based on Huffman coding and OR tree is proposed. The simulation results show that the algorithm is feasible in solving the problem of multi-value test and diagnosis strategy optimization. Finally, according to the input and output requirements of the diagnostic strategy optimization algorithm, a graphical interface is designed, which can be used in a small system. The operation is simpler and the output result is more intuitive through the graphical interface.
【学位授予单位】：郑州大学
【学位级别】：硕士
【学位授予年份】：2015
【分类号】：TN06

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