数字集成电路中的老化预测传感器设计

发布时间：2018-06-24 11:21

本文选题：负偏置温度不稳定性 + 电路老化　；参考：《安徽理工大学》2017年硕士论文

【摘要】：微电子技术已经成为21世纪不可或缺的技术,与我们的生活息息相关。它是计算技术、自动控制、纳米、通信技术的基础。集成度的日益提高,特征工艺尺寸的不断缩小,性能与功耗的同步增长以及由负偏置不稳定效应引起的老化已经成为影响集成电路可靠性的重要因素。论文首先介绍了影响集成电路可靠性的原因以及主要因素。影响集成电路可靠性的主要因素有电路老化和软错误,本文通过具体的案例分析了老化和软错误防护方法;另一方面,老化的防护方法又可分为老化检测和老化预测两种,论文分别通过电路时序图分析了老化预测和老化检测的工作机理,并通过具体的图表分析了二者的优缺点。其次,论文针对传统老化预测传感器结构的不足,提出了一种容软错误的可编程老化预测传感器,该新型老化预测传感器将软错误的保护方法引入到老化预测的结构之中,使传感器的结构不仅能够预测电路的老化,同时能够抵抗软错误;在此传感器的构架中引入的延迟单元通过改变其接地的开关的数量来达到改变保护区域宽度的目的,最终使得保护区域达到可编程的目的。论文还提出了一种保护区域宽度可调控的老化预测传感器,该新型老化预测传感器在老化检测技术的基础上加以改进,使该传感器具备老化预测的功能;同时可以通过改变输入时钟信号的波形来达到改变保护区域宽度的目的;在该传感器的输出部分采用C单元来替代传统的锁存器,使整个触感器的面积开销有所降低。论文最后运用电路仿真软件对本文提出的传感器进行仿真,通过在不同的情况下的实验数据来观察该传感器对于老化和软错误的抵抗能力。同时将该传感器的面积开销和功耗与其他经典的老化预测的传感器作对比。实验结果表明,本文提出的老化预测传感器,可以通过改变其保护区域的宽度来控制老化预测的范围,同时可以在一定的程度上抵抗软错误,并且本文提出的容软错误的老化预测传感器与传统经典老化预测传感器的结构相比,其面积开销更低和功耗更小。
[Abstract]:Microelectronics technology has become an indispensable technology in the 21 st century, which is closely related to our daily life. It is the basis of computing technology, automatic control, nanotechnology and communication technology. The improvement of integration, the shrinking of characteristic process size, the synchronous growth of performance and power consumption, and the aging caused by negative bias instability have become important factors affecting the reliability of integrated circuits. Firstly, the paper introduces the reasons and main factors that affect the reliability of integrated circuits. The main factors that affect the reliability of integrated circuits are circuit aging and soft errors. This paper analyzes the methods of protection against aging and soft errors through specific cases, on the other hand, the methods of protection against ageing can be divided into two kinds: aging detection and aging prediction. In this paper, the working mechanism of aging prediction and aging detection is analyzed by circuit sequence diagram, and their advantages and disadvantages are analyzed by specific diagrams. Secondly, aiming at the shortage of the traditional aging prediction sensor, a programmable aging prediction sensor with soft error tolerance is proposed. The new aging prediction sensor introduces the soft error protection method into the aging prediction structure. The structure of the sensor can not only predict the aging of the circuit, but also resist the soft error. The delay unit introduced in the structure of the sensor can change the width of the protection area by changing the number of switches on the ground. Finally, the protected area is programmable. In this paper, a new aging prediction sensor with adjustable area width is proposed, which can be improved on the basis of aging detection technology, so that the sensor has the function of aging prediction. At the same time, the width of the protection area can be changed by changing the waveform of the input clock signal. C unit is used to replace the traditional latch in the output part of the sensor, which reduces the area overhead of the whole tactile sensor. In the end, the sensor is simulated by circuit simulation software, and the resistance of the sensor to aging and soft error is observed by the experimental data under different conditions. At the same time, the area overhead and power consumption of the sensor are compared with other classical aging prediction sensors. The experimental results show that the proposed aging prediction sensor can control the range of aging prediction by changing the width of its protection area, and can resist soft errors to a certain extent. Compared with the structure of the classical aging prediction sensor, the area overhead and power consumption of the soft-error-tolerant aging prediction sensor proposed in this paper are lower than that of the classical aging prediction sensor.
【学位授予单位】：安徽理工大学
【学位级别】：硕士
【学位授予年份】：2017
【分类号】：TP212;TN431.2

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