红外焦平面阵列像元级参数测试方法研究

发布时间：2018-06-25 16:17

本文选题：红外焦平面阵列 + 测试方法　；参考：《中国科学院大学（工程管理与信息技术学院）》2015年硕士论文

【摘要】：红外探测技术在军事民用领域应用越来越广泛,红外焦平面阵列是探测器系统的核心器件,对其关键参数测试技术的研究需求也越来越迫切。红外焦平面阵列由大量敏感像元构成,像元参数与探测器系统整体性能密切相关。目前红外焦平面阵列的测试工作主要集中在系统级参数测试部分,对像元级参数测试的研究较少且大多处于理论分析层面,因此关于红外焦平面阵列像元级参数测试方法的研究急需加强。论文所做的工作包括： (1)论文对目前红外焦平面阵列测试技术国内外研究现状进行分析,详细阐述了像元级参数与系统性能之间的关系,明确了像元级参数测试的意义。 (2)论文系统地研究了红外焦平面阵列敏感像元热学参数与噪声参数的工程性测试方法,采用电学功率测试法以及惠斯通电桥法测试敏感像元热导参数与热时间常数,并基于虚拟仪器技术进行像元噪声参数测试,解决了已有技术测试流程繁琐、测试精度不足的问题。论文详细介绍了各参数的物理意义,通过理论计算与建模仿真得到可供测试参考的理论数值；分别对各参数进行样品性能测试与数据分析,并对所测像元级参数进行推导得到能够反映系统性能的响应率参数,实现对探测器系统性能的预估。 (3)在完成像元级参数测试方法研究的基础上,论文验证了此类方法在工程应用中的可行性。论文基于本领域成熟的系统级参数评判标准,对实验样品所组成的探测器系统进行系统级响应率、噪声参数测试,并将测试结果与像元级测试推导结果进行对比,从而完成对像元级参数测试方法可行性的分析验证工作。经验证分析,本论文所研究的像元级参数测试方法能够满足产品研发阶段分析测试要求,对产品设计优化具有指导意义,并能够为工艺开发提供数值参考,实时修正产品设计与制造工艺之间的偏差,从而缩短产品研发周期,为提升产品性能、优化产品设计提供及时有效的测试数据支持。
[Abstract]:Infrared detection technology is more and more widely used in military and civilian fields. Infrared focal plane array (IRFPA) is the core device of detector system. The infrared focal plane array consists of a large number of sensitive pixels. The pixel parameters are closely related to the overall performance of the detector system. At present, the testing work of infrared focal plane array is mainly focused on the system level parameter testing, and the research on pixel level parameter testing is less and most of them are in the theoretical analysis level. Therefore, the research on the pixel level parameters measurement of infrared focal plane arrays needs to be strengthened. The main contents of this paper are as follows: (1) the research status of infrared focal plane array (IRFPA) testing technology at home and abroad is analyzed, and the relationship between pixel level parameters and system performance is described in detail. The significance of pixel level parameter testing is clarified. (2) the engineering testing methods of infrared focal plane array sensitive pixel thermal parameters and noise parameters are systematically studied in this paper. The thermal conductivity parameters and thermal time constants of sensitive pixels are measured by using electrical power test method and Wheatstone bridge method, and the pixel noise parameters are measured based on virtual instrument technology. The problem of insufficient precision of the test. In this paper, the physical meaning of each parameter is introduced in detail, the theoretical values can be obtained by theoretical calculation and modeling and simulation, and the performance test and data analysis of each parameter are carried out respectively. Based on the derivation of the pixel level parameters, the response rate parameters which can reflect the system performance are obtained, and the performance of the detector system is predicted. (3) on the basis of the research of the pixel level parameter testing method, The paper verifies the feasibility of this method in engineering application. Based on the system level parameter evaluation standard, the system level response rate and noise parameter of the detector system composed of experimental samples are tested, and the test results are compared with the pixel level test results. Thus, the feasibility of pixel level parameter testing method is analyzed and verified. After verification and analysis, the pixel level parameter testing method studied in this paper can meet the requirements of product development stage analysis and test, and has guiding significance for product design optimization, and can provide a numerical reference for process development. The deviation between product design and manufacturing process can be corrected in real time so as to shorten the product R & D cycle and provide timely and effective test data support for improving product performance and optimizing product design.
【学位授予单位】：中国科学院大学（工程管理与信息技术学院）
【学位级别】：硕士
【学位授予年份】：2015
【分类号】：TN215

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