基于改进二分查找的VRC快速故障定位技术
发布时间：2018-07-27 20:32
【摘要】：针对虚拟可重构电路(virtual reconfigurable circuits,VRC)故障定位难、传统故障定位方法测试次数大等问题,提出一种基于改进二分查找的VRC快速故障定位技术.当VRC规模不大于两行(或两列)时,直接逐行(逐列)定位故障.当VRC规模大于两行和两列时,首先执行一次行测试和一次列测试,以确定可编程单元(programmable elements,PE)的故障可疑区域;然后比较故障可疑区域的行/列数量,以数量较少的作为故障测试方向;最后在测试方向上二分故障可疑区域,根据行/列测试原理配置电路并执行"与"操作,根据输出结果定位故障.当故障可疑区域无法二分时,可定位所有故障PE.故障定位性能分析表明:和常规的VRC故障定位技术相比,本文提出的VRC快速故障定位技术能够快速检测并隔离连续分布的无故障PE,快速缩小测试区域,大幅度降低故障定位测试次数,且出现最大测试次数的概率远小于前者,单故障和双故障定位的平均测试次数缩减量超过50%.基于改进二分查找的VRC快速故障定位技术的可行性和有效性得到验证,具有一定的通用性和工程应用价值.
[Abstract]:In view of the difficulties of fault location in virtual reconfigurable circuit (VRC) and the large test times of traditional fault location methods, a fast fault location technique for VRC based on improved binary search is proposed. When the VRC size is not greater than two rows (or two columns), locate the failure directly row by row (column by column). When the VRC size is larger than two rows and two columns, first perform a row test and a column test to determine the suspect area for the programmable elements PE; then compare the number of rows / columns in the suspect area. In the end, the circuit is configured according to the line / column test principle, and the "and" operation is performed to locate the fault according to the output result. When the suspected fault area cannot be dichotomized, all failure PEs can be located. The analysis of fault location performance shows that compared with the conventional VRC fault location technology, the proposed VRC fast fault location technique can quickly detect and isolate continuously distributed VRC, and reduce the test area quickly. The probability of maximum test times is much lower than that of the former, and the average number of times of single and double fault location is reduced by more than 50 times. The feasibility and validity of the VRC fast fault location technology based on improved binary search is verified, which has a certain generality and engineering application value.
【作者单位】： 军械工程学院电子与光学工程系;中国空气动力研究与发展中心超高速空气动力研究所;
【基金】：国家自然科学基金(61372039,61601495)
【分类号】：TN70
本文编号：2149057
[Abstract]:In view of the difficulties of fault location in virtual reconfigurable circuit (VRC) and the large test times of traditional fault location methods, a fast fault location technique for VRC based on improved binary search is proposed. When the VRC size is not greater than two rows (or two columns), locate the failure directly row by row (column by column). When the VRC size is larger than two rows and two columns, first perform a row test and a column test to determine the suspect area for the programmable elements PE; then compare the number of rows / columns in the suspect area. In the end, the circuit is configured according to the line / column test principle, and the "and" operation is performed to locate the fault according to the output result. When the suspected fault area cannot be dichotomized, all failure PEs can be located. The analysis of fault location performance shows that compared with the conventional VRC fault location technology, the proposed VRC fast fault location technique can quickly detect and isolate continuously distributed VRC, and reduce the test area quickly. The probability of maximum test times is much lower than that of the former, and the average number of times of single and double fault location is reduced by more than 50 times. The feasibility and validity of the VRC fast fault location technology based on improved binary search is verified, which has a certain generality and engineering application value.
【作者单位】： 军械工程学院电子与光学工程系;中国空气动力研究与发展中心超高速空气动力研究所;
【基金】：国家自然科学基金(61372039,61601495)
【分类号】：TN70
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