硅晶圆激光切割头及切割性能的研究
[Abstract]:Silicon wafer is a common semiconductor material. The traditional silicon wafer cutting method is high speed diamond wafer contact cutting. As a non-contact cutting method, laser cutting can effectively control the defects caused by non-uniform stress in contact. Firstly, according to the principle of motion and optical system of double-mirror laser cutting head, the special cutting head for silicon wafer cutting is designed by using solidworks software. The main design contents include optical fiber connection module, collimation module and robot connection module. The cutting range of the cutting head is 200mm 脳 200mm, and the cutting precision is 卤0.05mm. Through the verification of silicon wafer cutting, the design of double mirror laser cutting head meets the requirements of design and production. The picosecond laser cutting test of silicon wafer was carried out by using the designed double mirror laser cutting head. The cutting and implicit crystal cutting experiments were carried out by changing the cutting parameters such as the output power of picosecond laser, the laser pulse frequency and the cutting speed. The results show that the notch width and depth increase with the increase of laser output power, increase with the increase of laser pulse frequency, and decrease with the increase of cutting speed. The slagging height and spatter width increase with the increase of laser output power, increase with the increase of laser pulse frequency and decrease with the increase of cutting speed. The optimum technological parameters are as follows: laser power 30W, cutting speed 100mm / s, laser pulse frequency 40kHz. Through scanning electron microscope (SEM) and energy dispersive analyzer (EDS) to analyze the groove under the optimum technological parameters, the results show that although the energy density is high in the process of picosecond laser cutting, there is almost no oxidation around the notch. The physical and chemical properties of the material around the groove are guaranteed. The experimental results show that the optimum cutting parameters are laser output power of 0.88 W, laser pulse frequency of 80 kHz and cutting speed of 300 mm / s. Compared with the conventional slit size of silicon wafer (70 渭 m), the dimension (40 渭 m) of cryptocrystalline cutting is obviously reduced. Compared with the size (42 渭 m) of the water-conducting laser cutting of silicon wafers, the size of edge breaking is reduced by about 5%. In order to compare the effect of laser cutting method on the cutting quality of silicon wafer, the water conduction laser cutting method was used to cut silicon wafer. The optimum cutting parameters are water pressure 13MPa, power 2W, cutting speed 500mm / min. The optimum parameters of water-conducting laser cutting are water pressure 13MPa, power 2W, cutting speed 200mm / min. There is no splash area around the joint, the edge of the joint is flat and the seam is perpendicular. According to the characteristics of the section of the cutting joint, the section is divided into three regions. Region 1 (near the top surface of the notch), region 2 (middle area of the notch) and region 3 (near the surface of the cut joint), the surface roughness of region 1 is about 8.037-14.621 渭 m, the surface roughness of region 2 is about 4.908-6.640 渭 m, the surface roughness of region 3 is about 6.344-7.108 渭 m, the results show that the surface roughness of region 1 is about 8.037-14.621 渭 m, and that of region 2 is about 6.344-7.108 渭 m. The surface roughness of the three regions is different greatly, the roughness of region 2 is the smallest, the roughness of region 3 is the second, and the roughness of region 1 is the largest, and the size of water conduction laser cutting seam is about 42 渭 m, which is reduced by 40% compared with the traditional cutting dimension (70 渭 m).
【学位授予单位】:沈阳工业大学
【学位级别】:硕士
【学位授予年份】:2017
【分类号】:TN305.1
【参考文献】
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